N74F257AN PHILIPS [NXP Semiconductors], N74F257AN Datasheet - Page 5
![no-image](/images/no-image-200.jpg)
N74F257AN
Manufacturer Part Number
N74F257AN
Description
Quad 2-line to 1-line selector/multiplexer, non-inverting 3-State
Manufacturer
PHILIPS [NXP Semiconductors]
Datasheet
1.N74F257AN.pdf
(10 pages)
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
4. Measure I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
AC ELECTRICAL CHARACTERISTICS
1995 Mar 31
SYMBOL
SYMBOL
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
t
t
t
t
t
t
t
t
I
IH
IL
OZH
OZL
OS
CC
PLH
PHL
PLH
PHL
PZH
PZL
PHZ
PLZ
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
O
OH
O
OL
IK
CC
Propagation delay
In to Yn
Propagation delay
S to Yn
Output Enable time
to High or Low level
Output Disable time
from High or Low level
High level output voltage
High-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off state output current,
High-level voltage applied
Off state output current,
Low-level voltage applied
Short-circuit output current
Supply current
with all outputs open and inputs grounded.
PARAMETER
PARAMETER
PARAMETER
CC
4
4
(total)
= 5V, T
OS
tests should be performed last.
amb
3
= 25 C.
CONDITION
Waveform 1
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
I
I
I
CCH
CCL
CCZ
TEST
V
V
V
V
V
V
V
V
V
V
V
V
CC
CC
IH
CC
CC
IH
CC
CC
CC
CC
CC
CC
CC
CC
= MIN, I
= MIN, I
= MIN, V
= MIN, V
= MIN, I
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
MIN
3.0
2.0
5.0
4.0
4.5
4.5
2.0
2.0
T
V
amb
C
R
CC
,
,
TEST CONDITIONS
TEST CONDITIONS
L
L
OH
OL
OS
TYP
I
= 500
= 50pF
4.5
3.5
7.5
5.5
6.5
6.0
4.0
3.5
= +5.0V
= +25 C
IL
IL
IL
IL
= I
5
I
I
I
O
O
= MAX
= MAX
, the use of high-speed test apparatus and/or sample-and-hold
= 7.0V
= 2.7V
= 0.5V
= MAX,
= MAX,
IK
= 2.7V
= 0.5V
MAX
6.0
5.0
9.5
7.0
7.5
7.5
5.5
5.5
,
,
T
V
amb
CC
MIN
3.0
2.0
5.0
4.0
4.5
4.5
2.0
2.0
1
1
C
R
= +5.0V
= 0 C to +70 C
L
L
10%V
10%V
= 500
LIMITS
= 50pF
5%V
5%V
CC
CC
MAX
CC
CC
10.5
7.0
6.0
8.0
8.5
8.5
6.0
6.0
10%
MIN
2.4
2.7
-60
T
amb
V
MIN
CC
3.0
2.0
5.0
4.0
4.5
4.5
2.0
2.0
= –40 C to +85 C
LIMITS
C
R
–0.73
= +5.0V
TYP
0.35
0.35
14.5
15.0
3.3
9.0
L
L
= 500
= 50pF
2
Product specification
MAX
10.5
74F257A
7.0
7.0
8.5
8.5
8.5
6.0
6.0
10%
MAX
–150
0.50
0.50
–1.2
–0.6
15.0
22.0
23.0
100
–50
20
50
UNIT
UNIT
UNIT
mA
mA
mA
mA
mA
ns
ns
ns
ns
V
V
V
V
V
A
A
A
A