CAT5401WI-10 ONSEMI [ON Semiconductor], CAT5401WI-10 Datasheet - Page 6

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CAT5401WI-10

Manufacturer Part Number
CAT5401WI-10
Description
Quad Digitally Programmable Potentiometers with 64 Taps and SPI Interface
Manufacturer
ONSEMI [ON Semiconductor]
Datasheet
CAT5401
Power Up Timing
Write Cycle Limits
Reliability Characteristics
Figure 1. Synchronous Data Timing
Figure 2. HOLD
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) t
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Dashed Line = mode (1, 1) - - - - - - -
Doc. No. MD-2012 Rev. I
SCK
Symbol
Symbol
N
T
V
I
Symbol
LTH
SO
CS
DR
ZAP
SI
END
t
t
t
PUW
PUR
PUR
(3)
(3)
WR
(3)
HOLD
(3)
SCK
V
V
SO
V
CS
and t
V
V
IH
V
V
V
OH
OL
IL
IL
IL
IH
IH
¯¯¯¯¯ Timing
PUW
t
CSS
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Parameter
Power-up to Read Operation
Power-up to Write Operation
Parameter
Write Cycle Time
HI-Z
are delays required from the time V
(1)(2)
t
SU
VALID IN
t
HD
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
t
CD
t
HZ
t
WH
CC
t
H
is stable until the specified operation can be initiated.
6
t
WL
HIGH IMPEDANCE
t
V
t
HD
t
t FI
RI
t
HO
t
CD
t
1,000,000
LZ
2000
Min
100
100
Characteristics subject to change without notice
t
CSH
© 2008 SCILLC. All rights reserved.
Max
t
Max
Max
DIS
1
1
5
HI-Z
Cycles/Byte
Years
Units
mA
Units
Units
V
ms
ms
ms
t
CS

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