CAT24WC32 CATALYST [Catalyst Semiconductor], CAT24WC32 Datasheet - Page 2

• Manufacturer Part Number: CAT24WC32
• Description: 32K/64K-Bit I2C Serial CMOS E2PROM
• Manufacturer: CATALYST [Catalyst Semiconductor]

Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current
V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
(5) Maximum standby current (I
Doc. No. 1039, Rev. F
I
I
I
I
V
V
V
V
CC
SB
LI
LO
CC
CC
IL
IH
OL1
OL2
N
T
V
I
LTH
voltage on output pins is V
Respect to Ground
Capability (Ta = 25°C) ................................... 1.0W
DR
ZAP
END
(5)
C
C
with Respect to Ground ............... –2.0V to +7.0V
= +1.8V to +6.0V, unless otherwise specified.
I/O
IN
(3)
(3)(4)
(3)
(3)
(3)
(3)
Power Supply Current
Standby Current (V
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage (V
Output Low Voltage (V
Endurance
Data Retention
ESD Susceptibility
Latch-up
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, A2, SCL, WP)
T
A
= 25°C, f = 1.0 MHz, V
(1)
CC
........... –2.0V to +V
SB
+0.5V, which may overshoot to V
(2)
) = 10µA for the Automotive and Extended Automotive temperature range.
CC
........................ 100mA
CC
CC
= 5V)
= +3.0V)
= +1.8V)
1,000,000
2000
100
100
CC
CC
= 5V
+ 2.0V
V
CC
–1
x 0.7
CC
+ 2.0V for periods of less than 20ns.
2
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Cycles/Byte
8
6
Years
Volts
V
V
mA
CC
CC
0.4
0.5
10
10
x 0.3
+ 0.5
3
1
pF
pF
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
mA
µA
µA
µA
V
V
V
V
CC
+1V.
f
V
V
V
I
I
SCL
OL
OL
IN
IN
OUT
= 3.0 mA
= 1.5 mA
= GND or V
= GND to V
= 100 KHz
= GND to V
V
V
I/O
IN
= 0V
= 0V
CC
CC
CC