IDT71T016 Integrated Device Technology, IDT71T016 Datasheet - Page 4

• Manufacturer Part Number: IDT71T016
• Description: LOW POWER 2V CMOS SRAM 1 MEG (64K x 16-BIT)
• Manufacturer: Integrated Device Technology

IDT71T016
LOW POWER 2V CMOS STATIC RAM 1 MEG (64K x 16-BIT)
DATA RETENTION CHARACTERISTICS OVER ALL TEMPERATURE RANGES
(V
NOTES:
1. T
2. t
3. This parameter is guaranteed by device characterization, but is not production tested.
LOW V
AC TEST CONDITIONS
Symbol
V
I
t
t
LC
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
CCDR
CDR
R
V
CS
RC
DR
(3)
A
DD
= 0.2V, V
= +25 C.
= Read Cycle Time.
(3)
DD
DATA RETENTION WAVEFORM
V
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
HC
CC
= V
for Data Retention
Parameter
DD
- 0.2V)
t
CDR
1.8V
V
IH
GND to V
See Figure 1
Test Condition
V
V
DD
DD
3ns
CS
x 0.5
x 0.5
—
DD
V
HC
3777 tbl 09
RETENTION
V
MODE
DR
DATA
V
AC TEST LOAD
*Including jig and scope capacitance.
DR
1.5V
DATA
COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES
OUT
50pF*
t
Min.
RC
1.5
—
0
(2)
Figure 1. AC Test Load
V
1.8V
IH
Typ.
V
<1
—
—
—
DD
t
R
(1)
3070
3150
Max.
—
—
—
5
3777 drw 04
3777 drw 05
3777 tbl 09
Unit
ns
ns
V
4
A