SST29EE010-120-4C-EH SST [Silicon Storage Technology, Inc], SST29EE010-120-4C-EH Datasheet - Page 17

• Manufacturer Part Number: SST29EE010-120-4C-EH
• Description: 1 Megabit (128K x8) Page-Mode EEPROM
• Manufacturer: SST [Silicon Storage Technology, Inc]

1 Megabit Page-Mode EEPROM
SST29EE010 / SST29LE010 / SST29VE010
© 2000 Silicon Storage Technology, Inc.
AC test inputs are driven at V
inputs and outputs are V
F
F
IGURE
IGURE
TO DUT
13: A T
12: AC I
V IHT
V ILT
EST
NPUT
L
OAD
/O
INPUT
UTPUT
HT
E
(2.0 V) and V
XAMPLE
IHT
R
(2.4 V) for a logic “1” and V
EFERENCE
TEST LOAD EXAMPLE
V HT
V LT
LT
C L
W
(0.8 V). Inputs rise and fall times (10% « 90%) are <10 ns.
AVEFORMS
TO TESTER
REFERENCE POINTS
17
ILT
(0.4 V) for a logic “0”. Measurement reference points for
R L LOW
V HT
V LT
OUTPUT
Note: V
304 ILL F12.1
V
V
V
LT
IHT
ILT
HT
–V
–V
–V
–V
LOW
INPUT
HIGH
INPUT
304 ILL F13.0
V CC
Test
R L HIGH
Test
HIGH Test
LOW Test
304-3 6/00
5
6
7
8
13
14
15
16
1
2
3
4
9
10
11
12