hcts299ms Intersil Corporation, hcts299ms Datasheet - Page 7

no-image

hcts299ms

Manufacturer Part Number
hcts299ms
Description
Rad-hard 8-bit Universal Shift Register; Three-state
Manufacturer
Intersil Corporation
Datasheet
NOTES:
NOTE: 1. Alternate Group A Inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR =TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
MR to Output
OEn to Output
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
PARAMETER
CONFORMANCE GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
IOZL/IOZH
Subgroup B-5
Subgroup B-6
SYMBOL
TPHL
TPZH
TPHZ
TPZL
TPLZ
PARAMETER
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
Specifications HCTS299MS
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
CONDITIONS
(NOTES 1, 2)
SUBGROUP
GROUP B
5
5
5
630
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
2, 3, 8A, 8B, 10, 11
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
TEMPERATURE
±200nA
12µA
+25
+25
+25
o
o
o
C
C
C
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Subgroups 1, 2, 3, 9, 10, 11
o
C)
READ AND RECORD
MIN
2
2
2
2
2
Spec Number
200K RAD
LIMITS
MAX
36
25
27
34
34
UNITS
518640
ns
ns
ns
ns
ns

Related parts for hcts299ms