saa569x NXP Semiconductors, saa569x Datasheet - Page 103
saa569x
Manufacturer Part Number
saa569x
Description
Enhanced Tv Microcontrollers With On-screen Display Osd
Manufacturer
NXP Semiconductors
Datasheet
1.SAA569X.pdf
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Philips Semiconductors
29 QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Integrated Circuits “SNW-FQ-611D” . The
principal requirements are shown in Tables 45, 46 and 47.
29.1
Table 45 Acceptance tests per lot
Note
1. ppm = fraction of defective devices, in parts per million.
29.2
Table 46 Reliability tests (by process family)
Note
1. FPM = fraction of devices failing at test condition, in Failures Per Million.
Table 47 Reliability tests (by device type)
2002 May 06
Mechanical
Electrical
High temperature operating life
Humidity life
Temperature cycling performance
ESD and latch-up
Enhanced TV microcontrollers with
On-Screen Display (OSD)
Lot acceptance
Reliability Performance
TEST
TEST
TEST
cumulative target: <80 ppm
cumulative target: <100 ppm
168 hours at T
temperature, humidity, bias 1000 hours,
85 C, 85% RH (or equivalent test)
ESD Human Body Mode; 100 pF
and 1.5 k
ESD Machine Model; 200 pF and 0
latch-up
65 to 150 C
CONDITIONS
CONDITIONS
j
= 150 C
103
REQUIREMENTS
<500 FPM
<1000 FPM
<2000 FPM
2000 V
200 V
100 mA, 1.5
(1)
SAA567x; SAA569x
REQUIREMENTS
REQUIREMENTS
V
DD(max)
Objective specification
(1)
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