k9f1208u0b-h Samsung Semiconductor, Inc., k9f1208u0b-h Datasheet - Page 12

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k9f1208u0b-h

Manufacturer Part Number
k9f1208u0b-h
Description
64m X 8 Bit Nand Flash Memory
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
K9F1208Q0B
K9F1208D0B
K9F1208U0B
DC AND OPERATING CHARACTERISTICS
NOTE : VIL can undershoot to -0.4V and VIH can overshoot to VCC +0.4V for durations of 20 ns or less.
Stand-by Current(TTL)
Stand-by Current(CMOS)
Input Leakage Current
Output Leakage Current
Input High Voltage
Input Low Voltage, All
inputs
Output High Voltage Level
Output Low Voltage Level
Output Low Current(R/B)
Operating
Current
Parameter
Sequential Read
Program
Erase
Symbol
I
OL
I
I
I
I
I
V
V
V
V
CC
CC
CC
SB
SB
I
(R/B)
I
LO
LI
IH*
OH
OL
IL*
1
2
3
1
2
tRC=50ns, CE=V
I
CE=V
CE=V
V
V
I/O pins
Except I/O pins
K9F1208Q0B :I
K9F1208D0B :I
K9F1208U0B :I
K9F1208Q0B :I
K9F1208D0B :I
K9F1208U0B :I
K9F1208Q0B :V
K9F1208D0B :V
K9F1208U0B :V
OUT
IN
OUT
=0 to Vcc(max)
=0mA
Test Conditions
=0 to Vcc(max)
IH
CC
, WP=0V/V
-0.2, WP=0V/V
-
-
-
OH
OH
OL
OL
OH
OL
OL
OL
OL
IL
=100 A
=2.1mA
=100uA
=-100 A
=-400 A
=-100 A
=0.1V
=0.4V
CC
=0.1V
CC
(Recommended operating conditions otherwise noted.)
V
V
12
Min
-0.4
V
-0.4
-0.3
-0.1
CCQ
CCQ
3
CC
-
-
-
-
-
-
-
-
1.8V
Typ
10
8
8
8
4
-
-
-
-
-
-
-
-
V
Max
+0.3
+0.3
V
0.4
0.1
15
15
15
50
CCQ
1
10
10
CC
-
-
V
V
Min
-0.4
V
-0.4
-0.3
-0.4
CCQ
CCQ
K9F1208X0B
3
-
-
-
-
-
-
-
CC
-
2.65V
Typ
10
10
10
10
4
-
-
-
-
-
-
-
-
V
Max
+0.3
+0.3
V
0.5
0.4
FLASH MEMORY
20
20
20
50
CCQ
1
10
10
CC
-
-
Min
-0.3
2.0
2.0
2.4
8
-
-
-
-
-
-
-
-
3.3V
Typ
10
10
10
10
10
-
-
-
-
-
-
-
-
Advance
V
+0.3
+0.3
Max
V
0.8
0.4
20
20
20
50
CCQ
1
10
10
CC
-
-
Unit
mA
mA
V
A

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