mt18htf25672fd Micron Semiconductor Products, mt18htf25672fd Datasheet - Page 4
![no-image](/images/no-image-200.jpg)
mt18htf25672fd
Manufacturer Part Number
mt18htf25672fd
Description
Ddr2 Sdram Fbdimm
Manufacturer
Micron Semiconductor Products
Datasheet
1.MT18HTF25672FD.pdf
(12 pages)
Table 6: Pin Descriptions
PDF: 09005aef81a2f237
htf18c128_256x72fdy.pdf - Rev. D 12/09 EN
PN#[13:0]
SN#[13:0]
Symbol
PN[13:0]
SN[13:0]
PS#[9:0]
SS#[9:0]
RESET#
M_Test
SA[2:0]
PS[9:0]
V
SS[9:0]
SCK#
DNU
SDA
SCK
V
DDSPD
SCL
V
V
V
DD
CC
SS
TT
Output
Output
Output
Output
Supply
Supply
Supply
Supply
Supply
Supply
Type
Input
Input
Input
Input
Input
Input
Input
I/O
I/O
–
–
Description
Primary southbound data, positive lines.
Primary southbound data, negative lines.
System clock input, positive line.
System clock Input, negative line.
Serial presence-detect (SPD) clock input.
Secondary southbound data, positive lines.
Secondary southbound data, negative lines.
Primary northbound data, positive lines.
Primary northbound data, negative lines.
Secondary northbound data, positive lines.
Secondary northbound data, negative lines.
SPD address inputs, also used to select the FBDIMM number in the AMB.
SPD data input/output.
AMB reset signal.
AMB core power and AMB channel interface power (1.5V).
DRAM power and AMB DRAM I/O power (1.8V).
SPD/AMB SMBUS power (3.3V).
Ground.
DRAM address/command/clock termination power (V
The M_Test pin provides an external connection for testing the margin of V
duced by a voltage divider on the module. It is not intended to be used in normal system
operation and must not be connected (DNU) in a system. This test pin may have other fea-
tures on future card designs and will be included in this specification at that time.
Do not use.
1GB, 2GB (x72, DR) 240-Pin DDR2 SDRAM FBDIMM
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Pin Assignments and Descriptions
DD
/2).
© 2005 Micron Technology, Inc. All rights reserved.
REF
, which is pro-