mtfdbac025sae-1b1es Micron Semiconductor Products, mtfdbac025sae-1b1es Datasheet - Page 17

• Manufacturer Part Number: mtfdbac025sae-1b1es
• Description: P200 2.5-inch Nand Flash Ssd
• Manufacturer: Micron Semiconductor Products

Reliability
Mean Time Between Failures
Endurance
PDF: 09005aef83687473
realssd_p200_2_5.pdf - Rev. C 9/09 EN
Notes:
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and firm-
ware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 8: Uncorrectable Bit Error Rate
Mean time between failures (MTBFs) for the SSD can be predicted based on the compo-
nent reliability data using the methods referenced in the Telcordia SR-332 reliability
prediction procedures for electronic equipment.
Table 9: MTBFs
Table 10: Drive Lifetime
Endurance for the SSD can be predicted based on the usage conditons applied to the
device, the internal NAND component cycles, the write amplification factor, and the wear-
leveling efficenty of the drive. The table below shows the drive lifetime for each SSD
density based on predefined usage conditions.
Uncorrectable Bit Error Rate
<1 sector per 10
Density
25GB
50GB
Density
25GB
50GB
1. Total bytes written calculated with the drive 90% full.
2. Access patterns consist of the following: 5% are 4k; 5% are 8k; 10% are 16k; 10% are
3. GB/day can be calculated by dividing the total bytes written value by (365 × number of
32k; 35% are 64K; and 35% are 128k.
years).
15
bits read
17
Drive Lifetime (Total Bytes Written)
Micron Technology, Inc. reserves the right to change products or specifications without notice.
MTBF (Operating Hours)
P200 2.5-Inch NAND Flash SSD
365TB
730TB
1 million
1 million
©2007 Micron Technology, Inc. All rights reserved.
Operation
READ
Reliability