74LCX00TTR STMicroelectronics, 74LCX00TTR Datasheet - Page 7
![IC GATE NAND QUAD 2INPUT 14TSSOP](/photos/6/95/69519/497-14-tssop_series_sml.jpg)
74LCX00TTR
Manufacturer Part Number
74LCX00TTR
Description
IC GATE NAND QUAD 2INPUT 14TSSOP
Manufacturer
STMicroelectronics
Series
74LCXr
Datasheet
1.74LCX00MTR.pdf
(15 pages)
Specifications of 74LCX00TTR
Logic Type
NAND Gate
Number Of Inputs
2
Number Of Circuits
4
Current - Output High, Low
24mA, 24mA
Voltage - Supply
2 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
14-TSSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-7092-2
74LCX00TTR
74LCX00TTR
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
74LCX00
5
Table 7. AC electrical characteristics
1. Skew is defined as the absolute value of the difference between the actual propagation delay for any two
2. Parameter guaranteed by design
Table 8. Capacitive characteristics
1.
Test circuit
Figure 4.
C
R
R
t
Symbol
Symbol
T
L
L
PLH
t
t
C
outputs of the same device switching in the same direction, either HIGH or LOW (t
t
operating current consumption without load. (Refer to Test Circuit). Average operating current can be
obtained by the following equation. I
= 50pF or equivalent (includes jig and probe capacitance)
= 500
OSLH
OSHL
C
= Z
OSHL
C
PD
IN
PD
t
PHL
OUT
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the
= | t
Ω
Input capacitance
Power dissipation
capacitance
Propagation delay
time
Output to output
skew time
of pulse generator (typically 50
PHLm
or equivalent
Test circuit
Parameter
- t
PHLn
Parameter
(1) (2)
|)
(1)
3.0 to 3.6
3.0 to 3.6
V
CC(opr)
2.7
(V)
CC
= C
V
(V)
3.3
3.3
CC
PD
Test condition
Ω
(pF)
Test condition
C
x V
50
50
)
L
CC
V
V
x f
f
IN
IN
IN
IN
= 0 or V
= 0 to V
= 10MHz
500
500
+ I
(Ω)
R
L
CC
/4 (per gate)
CC
CC
t
s
(ns)
2.5
2.5
= t
Min
r
OSLH
T
A
Min
-40 to 85 °C
1.0
Value
= 25 °C
Typ
35
6
= | t
Value
PLHm
Max
5.1
4.3
1.0
Max
Test circuit
- t
PLHn
Unit
Unit
|,
ns
ns
pF
pF
7/15