pa886c02r Fuji Electric holdings CO.,Ltd, pa886c02r Datasheet - Page 4

• Manufacturer Part Number: pa886c02r
• Description: Silicon Diode
• Manufacturer: Fuji Electric holdings CO.,Ltd

Fuji Electric Device Technology Co.,Ltd.
4. TEST AND INSPECTION
4.1 STANDARD TEST CONDITION
4.2 STRUCTURE INSPECTION
4.3 FORWARD AND REVERSE CHARACTERISTICS
4.4 TEST
Standard test condition is Ta=25℃、65%R.H.
If judgment is no doubt, the test condition is possible to test in normal condition
Ta=5～35℃、48～85%R.H.
It inspect with eye and measure, Item 2 shall be satisfied.
It inspect on the standard condition, Item 3.2 shall be satisfied.
Test
No.
1
2
3
4
5
6
7
Solder ability 1
Solder ability 2
Terminal
Strength
(Tensile)
Terminal
Strength
(Bending)
Mounting
Strength
Vibration
Shock
Resistance to
Soldering
Heat
Items
Test
Pull force : 25N
Force maintaining duration :10±1s
Load force : 10N
Number of times : 2times(90deg./time)
Screwing torque value:(M3) : 50±10N・cm
Frequency : 100Hz to 2kHz
Acceleration : 100m/s
Sweeping time : 4min./1 cycle
4times for each X, Y&Z directions.
Peak amplitude : 15km/s
Duration time : 0.5ms
3times for each X, Y&Z directions.
Solder : Sn-37Pb
Solder temp. : 235±5℃
Immersion time : 5±0.5s
Apply to flux
Solder : Sn-3Ag-0.5Cu
Solder temp. : 245±5℃
Immersion time : 5±0.5s
Apply to flux
Solder temp. : 260±5°C
Immersion time : 10±1s
Number of times : 1times
Testing methods and Conditions
2
2
MS5D3028
EIAJ
ED4701/401
method 1
EIAJ
ED4701/401
method 3
EIAJ
ED4701/402
method 2
EIAJ
ED4701/403
test code D
EIAJ
ED4701/404
test code D
EIAJ
ED4701/303
test code A
EIAJ
ED4701/302
test code A
Reference
Standard
ED4701
―――
EIAJ
Sampling
number
4/12
5
5
5
5
5
5
5
5
H04-004-03a
Acceptance
number
(0 : 1)