mc9s08jm60 Freescale Semiconductor, Inc, mc9s08jm60 Datasheet - Page 368

• Manufacturer Part Number: mc9s08jm60
• Description: Hcs08 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

Appendix A Electrical Characteristics
A.14 USB Electricals
The USB electricals for the S08USBV1 module conform to the standards documented by the Universal
Serial Bus Implementers Forum. For the most up-to-date standards, visit http://www.usb.org.
If the Freescale S08USBV1 implementation has electrical characteristics that deviate from the standard or
require additional information, this space would be used to communicate that information.
A.15 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer must consult Freescale applications notes such as AN2321, AN1050, AN1263, AN2764,
and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.15.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
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2
3
4
5
The frequency of this clock is controlled by a software setting.
These values are hardware state machine controlled. User code does not need to count cycles. This information
supplied for calculating approximate time to program and erase.
Typical endurance for Flash is based on the intrinsic bitcell performance. For additional information on how
Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical
Endurance for Nonvolatile Memory.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25 °C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines
typical data retention, please refer to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.
Regulator operating voltage
VREG output
V
VREG disabled
VREG Quiescent Current
USB33
Radiated Emissions
input with internal
Table A-17. Internal USB 3.3V Voltage Regulator Characteristics
MC9S08JM60 Series Data Sheet, Rev. 2
Symbol
V
V
V
usb33in
I
regout
VRQ
regin
Unit
mA
V
V
V
Min
3.9
—
3
3
Typ
3.3
3.3
0.5
—
Freescale Semiconductor
Max
5.5
3.6
3.6
—