lpc2939fbd208 NXP Semiconductors, lpc2939fbd208 Datasheet

no-image

lpc2939fbd208

Manufacturer Part Number
lpc2939fbd208
Description
Arm9 Microcontroller With Can, Lin, And Usb
Manufacturer
NXP Semiconductors
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
LPC2939FBD208
Manufacturer:
NXP
Quantity:
105 000
Company:
Part Number:
LPC2939FBD208
Quantity:
72
Part Number:
lpc2939fbd208,551
Manufacturer:
NXP Semiconductors
Quantity:
10 000
1. General description
2. Features
The LPC2939 combine an ARM968E-S CPU core with two integrated TCM blocks
operating at frequencies of up to 125 MHz, Full-speed USB 2.0 Host/OTG/Device
controller, CAN and LIN, 56 kB SRAM, 768 kB flash memory, external memory interface,
three 10-bit ADCs, and multiple serial and parallel interfaces in a single chip targeted at
consumer, industrial, medical, and communication markets. To optimize system power
consumption, the LPC2939 has a very flexible Clock Generation Unit (CGU) that provides
dynamic clock gating and scaling.
I
I
I
I
I
I
LPC2939
ARM9 microcontroller with CAN, LIN, and USB
Rev. 01 — 11 June 2009
ARM968E-S processor running at frequencies of up to 125 MHz maximum.
Multilayer AHB system bus at 125 MHz with four separate layers.
On-chip memory:
Dual-master, eight-channel GPDMA controller on the AHB multilayer matrix which can
be used with the SPI interfaces and the UARTs, as well as for memory-to-memory
transfers including the TCM memories
External Static Memory Controller (SMC) with eight memory banks; up to 32-bit data
bus; up to 24-bit address bus
Serial interfaces:
N
N
N
N
N
N
N
N
N
N
N
Two Tightly Coupled Memories (TCM), 32 kB Instruction (ITCM), 32 kB Data TCM
(DTCM)
Two separate internal Static RAM (SRAM) instances; 32 kB SRAM and 16 kB
SRAM
8 kB ETB SRAM, also usable for code execution and data
768 kB high-speed flash program memory
16 kB true EEPROM, byte-erasable/programmable
USB 2.0 full-speed Host/OTG/Device controller with dedicated DMA controller and
on-chip device PHY
Two-channel CAN controller supporting FullCAN and extensive message filtering
Two LIN master controllers with full hardware support for LIN communication. The
LIN interface can be configured as UART to provide two additional UART
interfaces.
Two 550 UARTs with 16-byte Tx and Rx FIFO depths, DMA support, modem
control, and RS-485/EIA-485 (9-bit) support
Three full-duplex Q-SPIs with four slave-select lines; 16 bits wide; 8 locations deep;
Tx FIFO and Rx FIFO
Two I
2
C-bus interfaces
Preliminary data sheet

Related parts for lpc2939fbd208

lpc2939fbd208 Summary of contents

Page 1

LPC2939 ARM9 microcontroller with CAN, LIN, and USB Rev. 01 — 11 June 2009 1. General description The LPC2939 combine an ARM968E-S CPU core with two integrated TCM blocks operating at frequencies 125 MHz, Full-speed USB 2.0 ...

Page 2

... NXP Semiconductors I Other peripherals: N One 10-bit ADC with 5.0 V measurement range and eight input channels with conversion times as low as 2.44 s per channel N Two 10-bit ADCs, 8-channels each, with 3.3 V measurement range provide an additional 16 analog inputs with conversion times as low as 2.44 s per channel. Each channel provides a compare function to minimize interrupts. ...

Page 3

... Type number Package Name LPC2939FBD208 LQFP208 plastic low profile quad flat package; 208 leads; body 1.4 mm 3.1 Ordering options Table 2. Part options Type number Flash memory LPC2939FBD208 768 kB LPC2939_1 Preliminary data sheet Description SRAM SMC USB Host/ OTG/ device ...

Page 4

... NXP Semiconductors 4. Block diagram LPC2939 VECTORED INTERRUPT CONTROLLER CLOCK GENERATION UNIT RESET GENERATION UNIT POWER MANAGEMENT UNIT TIMER0/1 MTMR PWM0/1/2/3 3.3 V ADC1 ADC0 QUADRATURE ENCODER CAN0/1 GLOBAL ACCEPTANCE FILTER UART/LIN0 C0/1 Grey-shaded blocks represent peripherals and memory regions accessible by the GPDMA. ...

Page 5

... MAT0[0] [1] P0[29]/CAP0[1]/ 8 MAT0[ DD(IO) [1] P2[22]/SCK2/ 10 PCAP2[2]/D20 LPC2939_1 Preliminary data sheet 1 LPC2939FBD208 52 Pin configuration for LQFP208 package Description Function 0 Function 1 (default) IEEE 1149.1 test data out GPIO 2, pin 21 SPI2 SDI GPIO 0, pin 24 UART1 TXD GPIO 0, pin 25 UART1 RXD GPIO 0, pin 26 ...

Page 6

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [1] P2[23]/SCS1[0]/ 11 PCAP3[0]/D21 [1] P3[6]/SCS0[3]/ 12 PMAT1[0]/TXDL1 [1] P3[7]/SCS2[1]/ 13 PMAT1[1]/RXDL1 [1] P0[30]/CAP0[2]/ 14 MAT0[2] [1] P0[31]/CAP0[3]/ 15 MAT0[3] [1] P2[24]/SCS1[1]/ 16 PCAP3[1]/D22 [1] P2[25]/SCS1[2]/ 17 PCAP3[2]/D23 V 18 SS(IO) [2] P5[19]/USB_D+1 19 [2] P5[18]/USB_D 1 20 [2] P5[17]/USB_D+2 21 [2] P5[16]/USB_D DD(IO DD(CORE ...

Page 7

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin P4[8]/A22/DSR1 SS(IO) [1] P2[27]/CAP0[3]/ 40 MAT0[3]/EI7 [1] P5[8]/D20/U0OUT2 41 [1] P1[27]/CAP1[2]/ 42 TRAP2/PMAT3[3] [1] P1[26]/PMAT2[0]/ 43 TRAP3/PMAT3[2] [1] P4[20]/ 44 USB_VBUS2 V 45 DD(IO) [1] P1[25]/PMAT1[0]/ 46 USB_VBUS1/ PMAT3[ SS(CORE DD(CORE) [1] P1[24]/PMAT0[0]/ 49 USB_CONNECT1/ PMAT3[0] [1] P1[23]/RXD0/ 50 USB_SSPND1/ CS5 [1] P1[22]/TXD0/ 51 USB_UP_LED1/CS4 [1] TMS 52 [1] ...

Page 8

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [1] P4[12]/BLS0 64 [1] P2[1]/MAT2[1]/ 65 TRAP2/D9 [1] P5[12]/D24 DD(IO) [1] P4[1]/A9 68 [1] P3[10]/SDI2/ 69 PMAT1[4]/ USB_PWRD1 V 70 SS(CORE DD(CORE) [1] P5[1]/D9 72 [1] P3[11]/SCK2/ 73 PMAT1[5]/USB_LS1 [1] P4[17]/CS7/U1OUT2 74 [1] P1[15]/CAP2[1]/ 75 SCS0[0]/D1 [1] P4[9]/A23/DCD1 SS(IO) [1] P5[9]/D21/DTR0 78 [1] P1[14]/CAP2[0]/ 79 SCS0[3]/D0 [1] P4[21]/ 80 USB_OVRCR2 ...

Page 9

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [1] P2[4]/MAT1[0]/ 94 EI0/D12 [1] P2[5]/MAT1[1]/ 95 EI1/D13 [1] P1[9]/SDO1/ 96 RXDL1/CS1 V 97 SS(IO) [1] P1[8]/SCS1[0]/ 98 TXDL1/CS0 [1] P1[7]/SCS1[3]/RXD1 [1] P1[6]/SCS1[2]/ 100 TXD1/A6 [1] P2[6]/MAT1[2]/ 101 EI2/D14 [1] P1[5]/SCS1[1]/ 102 PMAT3[5]/A5 [1] P1[4]/SCS2[2]/ 103 PMAT3[4]/A4 [1] TRST 104 [1] RST 105 V 106 SS(OSC) [3] XOUT_OSC 107 ...

Page 10

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin V 120 SS(CORE) V 121 DD(CORE) [1] P1[0]/EI0/ 122 PMAT3[0]/A0 [1] P2[10]/USB_INT1/ 123 PMAT0[2]/SCS0[0] [1] P2[11]/USB_RST1/ 124 PMAT0[3]/SCK0 [1] P0[0]/PHB0/ 125 TXDC0/D24 V 126 SS(IO) [1] P4[13]/BLS1 127 [1] P0[1]/PHA0/ 128 RXDC0/D25 [1] P5[13]/D25 129 [1] P0[2]/CLK_OUT/ 130 PMAT0[0]/D26 [1] P4[2]/A10 131 ...

Page 11

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [1] P5[6]/D18/RI0 148 [1] P4[14]/BLS2 149 [1] P0[5]/IN0[1]/ 150 PMAT0[3]/D29 [1] P5[14]/ 151 USB_SSPND1/RTS0 V 152 DD(IO) [1] P0[6]/IN0[2]/ 153 PMAT0[4]/D30 [1] P0[7]/IN0[3]/ 154 PMAT0[5]/D31 V 155 DDA(ADC3V3) [1] JTAGSEL 156 V 157 DDA(ADC5V0) [3] VREFP 158 [3] VREFN 159 [4] P0[8]/IN1[0]/TXDL0/ 160 ...

Page 12

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [4] P0[13]/IN1[5]/ 175 PMAT1[3]/A11 V 176 DD(IO) [1] P4[11]/WE/CTS0 177 [4] P0[14]/IN1[6]/ 178 PMAT1[4]/A12 [1] P5[11]/D23/DCD0 179 [4] P0[15]/IN1[7]/ 180 PMAT1[5]/A13 [1] P4[23]/ 181 USB_PWRD2 [4] P0[16]IN2[0]/ 182 TXD0/A22 [1] P4[7]/A21/DTR1 183 V 184 SS(IO) [1] P5[7]/D19/ 185 U0OUT1 [4] P0[17]/IN2[1]/ 186 RXD0/A23 [1] P4[15]/BLS3 ...

Page 13

... NXP Semiconductors Table 3. LQFP208 pin assignment Pin name Pin [4] P0[20]/IN2[4]/ 200 PMAT2[2]/A16 [4] P0[21]/IN2[5]/ 201 PMAT2[3]/A17 [4] P0[22]/IN2[6]/ 202 PMAT2[4]/A18 V 203 SS(IO) [4] P0[23]/IN2[7]/ 204 PMAT2[5]/A19 [1] P2[20]/ 205 PCAP2[0]/D18 V 206 DD(CORE) V 207 SS(CORE) [1] TDI 208 [1] Bidirectional pad; analog port; plain input; 3-state output; slew rate control tolerant; TTL with hysteresis; programmable pull-up / pull-down / repeater ...

Page 14

... NXP Semiconductors 6. Functional description 6.1 Architectural overview The LPC2939 consists of: • An ARM968E-S processor with real-time emulation support • An AMBA multilayer Advanced High-performance Bus (AHB) for interfacing to the on-chip memory controllers • Two DTL buses (an universal NXP interface) for interfacing to the interrupt controller and the Power, Clock and Reset Control SubSystem (PCRSS) • ...

Page 15

... NXP Semiconductors The ARM968E-S processor also employs a unique architectural strategy known as THUMB, which makes it ideally suited to high-volume applications with memory restrictions or to applications where code density is an issue. The key idea behind THUMB is that of a super-reduced instruction set. Essentially, the ARM968E-S processor has two instruction sets: • ...

Page 16

Memory map LPC2939 0xFFFF FFFF VIC 0xFFFF F000 reserved PCR/VIC 0xFFFF C000 subsystem CGU1 0xFFFF B000 PMU 0xFFFF A000 RGU 0xFFFF 9000 CGU0 0xFFFF 8000 0xE00E 0000 reserved 0xE00C A000 quadrature encoder 0xE00C 9000 PWM3 0xE00C 8000 PWM2 0xE00C ...

Page 17

... NXP Semiconductors 6.6 Reset, debug, test, and power description 6.6.1 Reset and power-up behavior The LPC2939 contains external reset input and internal power-up reset circuits. This ensures that a reset is extended internally until the oscillators and flash have reached a stable state. See Section 9 the reset pin. ...

Page 18

... NXP Semiconductors 6.6.3.1 ETM/ETB The ETM provides real-time trace capability for deeply embedded processor cores. It outputs information about processor execution to a trace buffer. A software debugger allows configuration of the ETM using a JTAG interface and displays the trace information that has been captured in a format that a user can easily understand. The ETB stores trace data produced by the ETM ...

Page 19

... NXP Semiconductors Two of the base clocks generated by the CGU0 are used as input into a second, dedicated CGU (CGU1). The CGU1 uses its own PLL and fractional dividers to generate two base clocks for the USB controller and one base clock for an independent clock output. ...

Page 20

... NXP Semiconductors specific subsystem description. Some branch clocks have special protection since they clock vital system parts of the device and should not be switched off. See for more details of how to control the individual branch clocks. Table 7. Base clock BASE_SAFE_CLK BASE_SYS_CLK BASE_PCR_CLK ...

Page 21

... NXP Semiconductors Table 7. Base clock BASE_MSCSS_CLK BASE_UART_CLK BASE_ICLK0_CLK BASE_SPI_CLK BASE_TMR_CLK BASE_ADC_CLK - BASE_ICLK1_CLK [1] This clock is always on (cannot be switched off for system safety reasons). [2] In the peripheral subsystem parts of the Timers, watchdog timer, SPI and UART have their own clock source. See [3] In the Power Clock and Reset Control subsystem parts of the CGU, RGU, and PMU have their own clock source ...

Page 22

... NXP Semiconductors 6.8 Flash memory controller The flash memory has a 128-bit wide data interface and the flash controller offers two 128-bit buffer lines to improve system performance. The flash has to be programmed initially via JTAG. In-system programming must be supported by the bootloader. Flash memory contents can be protected by disabling JTAG access. Suspension of burning or erasing is not supported. The Flash Memory Controller (FMC) interfaces to the embedded fl ...

Page 23

... NXP Semiconductors With dual buffering, a secondary buffer line is used, the output of the flash being considered as the primary buffer primary buffer, hit data can be copied to the secondary buffer line, which allows the flash to start a speculative read of the next flash word. Both buffer lines are invalidated after: • ...

Page 24

... NXP Semiconductors Table 10. Sector number The index sector is a special sector in which the JTAG access protection and sector security are located. The address space becomes visible by setting the FS_ISS bit and overlaps the regular flash sector’s address space. ...

Page 25

... NXP Semiconductors 6.8.5 Clock description The flash memory controller is clocked by CLK_SYS_FMC, see 6.8.6 EEPROM EEPROM is a non-volatile memory mostly used for storing relatively small amounts of data, for example for storing settings. It contains one 16 kB memory block and is byte-programmable and byte-erasable. The EEPROM can be accessed only through the flash controller. ...

Page 26

... NXP Semiconductors Table 11. 32-bit system address bit field and Table 12. CS[2:0] 000 001 010 011 100 101 110 111 6.9.2 Pin description The external static-memory controller module in the LPC2939 has the following pins, which are combined with other functions on the port pins of the LPC2939. ...

Page 27

... NXP Semiconductors Fig 5. A timing diagram for writing to external memory is shown In between wait state settings is indicated with arrows. (1) BLS has the same timing configurations that use the byte lane enable signals to connect Fig 6. LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB ...

Page 28

... NXP Semiconductors Usage of the idle/turn-around time (IDCY) is demonstrated In are added between a read and a write cycle in the same external memory device. CLK(SYS) WE Fig 7. Address pins on the device are shared with other functions. When connecting external memories, check that the I/O pin is programmed for the correct function. Control of these settings is handled by the SCU ...

Page 29

... NXP Semiconductors 6.10.2 Clock description The DMA controller is clocked by CLK_SYS_DMA derived from BASE_SYS_CLK, see Section 6.11 USB interface The Universal Serial Bus (USB 4-wire bus that supports communication between a host and one or more (up to 127) peripherals. The bus supports hot plugging and dynamic confi ...

Page 30

... NXP Semiconductors • Fully compliant with On-The-Go supplement to the USB 2.0 Specification, Revision 1.0a • Hardware support for Host Negotiation Protocol (HNP) • Includes a programmable timer required for HNP and Session Request Protocol (SRP) • Supports any OTG transceiver compliant with the OTG Transceiver Specification (CEA-2011), Rev ...

Page 31

... NXP Semiconductors Table 14. USB OTG port pins Pin name Direction USB_CONNECT2 O USB_UP_LED2 O USB_PWRD2 I USB_PPWR2 O USB_OVRCR2 I 6.11.5 Clock description Access to the USB registers is clocked by the CLK_SYS_USB, derived from BASE_SYS_CLK, see the USB block, BASE_USB_CLK and BASE_USB_I2C_CLK (see 6.12 General subsystem 6.12.1 General subsystem clock description The general subsystem is clocked by CLK_SYS_GESS, see 6.12.2 Chip and feature identifi ...

Page 32

... NXP Semiconductors • Programmable input level and edge polarity • Event detection maskable • Event detection is fully asynchronous clock is required The event router allows the event source to be defined, its polarity and activation type to be selected and the interrupt to be masked or enabled. The event router can be used to start a clock on an external event ...

Page 33

... NXP Semiconductors 6.13.2 Watchdog timer The purpose of the watchdog timer is to reset the ARM9 processor within a reasonable amount of time if the processor enters an error state. The watchdog generates a system reset if the user program fails to trigger it correctly within a predetermined amount of time. Key features: • ...

Page 34

... NXP Semiconductors The key features are: • 32-bit timer/counter with programmable 32-bit prescaler • four 32-bit capture channels per timer. These take a snapshot of the timer value when an external signal connected to the TIMERx CAPn input changes state. A capture event may also optionally generate an interrupt. ...

Page 35

... NXP Semiconductors 6.13.3.2 Clock description The timer modules are clocked by two different clocks; CLK_SYS_PESS and CLK_TMRx ( 3), see for power management. The frequency of all these clocks is identical as they are derived from the same base clock BASE_CLK_TMR. The register interface towards the system bus is clocked by CLK_SYS_PESS ...

Page 36

... NXP Semiconductors 6.13.4.2 Clock description The UART modules are clocked by two different clocks; CLK_SYS_PESS and CLK_UARTx ( 1), see CLK_UARTx branch clock for power management. The frequency of all CLK_UARTx clocks is identical since they are derived from the same base clock BASE_CLK_UART. The register interface towards the system bus is clocked by CLK_SYS_PESS. The baud generator is clocked by the CLK_UARTx ...

Page 37

... NXP Semiconductors The SPI module’s operating mode, frame format, and word size are programmed through the SLVn_SETTINGS registers. A single combined interrupt request SPI_INTREQ output is asserted if any of the interrupts are asserted and unmasked. Depending on the operating mode selected, the SPI SCS outputs operate as an active-HIGH frame synchronization output for Texas Instruments synchronous serial frame format or an active-LOW chip select for SPI ...

Page 38

... NXP Semiconductors • All I/O pins default to input at reset to avoid any possible bus conflicts 6.13.6.1 Functional description The general-purpose I/O provides individual control over each bidirectional port pin. There are two registers to control I/O direction and output level. The inputs are synchronized to achieve stable read levels. ...

Page 39

... NXP Semiconductors • Listen-only mode (no acknowledge; no active error flags) • Reception of ‘own’ messages (self-reception request) • Full CAN mode for message reception 6.14.1.1 Global acceptance filter The global acceptance filter provides look-up of received identifiers - called acceptance filtering in CAN terminology - for all the CAN controllers. It includes a CAN ID look-up table memory, in which software maintains one to fi ...

Page 40

... NXP Semiconductors Table 21. Symbol LIN0/1 TXD LIN0/1 RXD 2 6.14.3 I C-bus serial I/O controllers The LPC2939 each contain two I 2 The I C-bus is bidirectional for inter-IC control using only two wires: a serial clock line (SCL) and a serial data line (SDA). Each device is recognized by a unique address and can operate as either a receiver-only device (e ...

Page 41

... NXP Semiconductors • Two 10-bit, 400 ksamples/s, 8-channel ADCs with 3.3 V inputs and various trigger- start options • One 10-bit, 400 ksamples/s, 8-channel ADC with 5 V inputs (5 V measurement range) and various trigger-start options • Four 6-channel PWMs (Pulse-Width Modulators) with capture and trap functionality • ...

Page 42

... NXP Semiconductors MSCSS PAUSE Fig 8. Modulation and sampling control subsystem (MSCSS) block diagram LPC2939_1 Preliminary data sheet AHB-TO-APB BRIDGE QEI ADC0 start synch start ADC1 MSCSS TIMER0 synch start ADC2 start PWM0 carrier synch carrier PWM1 MSCSS TIMER1 carrier carrier ...

Page 43

... NXP Semiconductors 6.15.2 Pin description The pins of the LPC2939 MSCSS associated with the three ADC modules are described in Section Section Section Section 6.15.3 Clock description The MSCSS is clocked from a number of different sources: • CLK_SYS_MSCSS_A clocks the AHB side of the AHB-to-APB bus bridge • ...

Page 44

... NXP Semiconductors 6.15.4.1 Functional description The ADC block diagram, functionality is divided into two major parts; one part running on the MSCSS Subsystem clock, the other on the ADC clock. This split into two clock domains affects the behavior from a system-level perspective. The actual analog-to-digital conversions take place in the ADC clock domain, but system control takes place in the system clock domain. A mechanism is provided to modify confi ...

Page 45

... NXP Semiconductors Table 23. Symbol ADC0 IN[7:0] ADC1/2 IN[7:0] ADCn_EXTSTART VREFN VREFP V DDA(ADC5V0) V DDA(ADC3V3) [1] VREFP, VREFN, V [2] The analog inputs of ADC0 are internally multiplied by a factor of 3 3.3 V, the maximum digital result is 1024 [3] V DDA(ADC5V0) Remark: The following formula only applies to ADC0: Voltage variations on VREFP (i.e. those that deviate from voltage variations on the ...

Page 46

... NXP Semiconductors • Six pulse-width modulated output signals • Double edge features (rising and falling edges programmed individually) • Optional interrupt generation on match (each edge) • Different operation modes: continuous or run-once • 16-bit PWM counter and 16-bit prescale counter allow a large range of PWM periods • ...

Page 47

... NXP Semiconductors APB system bus IRQ pwm IRQ capt_match Fig 10. PWM block diagram The PWM block diagram in functionality is split into two major parts, a APB domain and a PWM domain, both of which run on clocks derived from the BASE_MSCSS_CLK. This split into two domains affects behavior from a system-level perspective ...

Page 48

... NXP Semiconductors 6.15.5.3 Master and slave mode A PWM module can provide synchronization signals to other modules (also called Master mode). The signal sync_out is a pulse of one clock cycle generated when the internal PWM counter (re)starts. The signal trans_enable_out is a pulse synchronous to sync_out, generated if a transfer from system registers to PWM shadow registers occurred when the PWM counter restarted ...

Page 49

... NXP Semiconductors 6.15.6.1 Pin description MSCSS timer 0 has no external pins. MSCSS timer 1 has a PAUSE pin available as external pin. The PAUSE pin is combined with other functions on the port pins of the LPC2939. external pin. Table 25. Symbol MSCSS PAUSE 6.15.6.2 Clock description The Timer modules in the MSCSS are clocked by CLK_MSCSS_MTMRx ( 1), see Section power management ...

Page 50

... NXP Semiconductors 6.15.7.1 Pin description The QEI module in the MSCSS has the following pins. These are combined with other functions on the port pins of the LPC2939. Table 26. Symbol QEI0 IDX QEI0 PHA QEI0 PHB 6.15.7.2 Clock description The QEI module is clocked by CLK_MSCSS_QEI, see this clock is identical to CLK_MSCSS_APB since they are derived from the same base clock BASE_MSCSS_CLK ...

Page 51

... NXP Semiconductors EXTERNAL OSCILLATOR LOW POWER RING OSCILLATOR CGU0 REGISTERS AHB2DTL BRIDGE RGU REGISTERS POR reset from watchdog counter RST (device pin) Fig 11. PCRSS block diagram 6.16.1 Clock description The PCRSS is clocked by a number of different clocks. CLK_SYS_PCRSS clocks the AHB side of the AHB to DTL bus bridge and CLK_PCR_SLOW clocks the CGU, RGU and PMU internal logic, see BASE_SYS_CLK, which can be switched off in low-power modes ...

Page 52

... NXP Semiconductors 6.16.2 Clock Generation Unit (CGU0) The key features are: • Generation of 11 base clocks selectable from several embedded clock sources • Crystal oscillator with power-down • Control PLL with power-down • Very low-power ring oscillator, always on to provide a safe clock • ...

Page 53

... NXP Semiconductors CLOCK GENERATION UNIT (CGU0) 400 kHz LP_OSC EXTERNAL PLL OSCILLATOR FREQUENCY MONITOR Fig 12. Block diagram of the CGU0 (see There are two primary clock generators: a low-power ring oscillator (LP_OSC) and a crystal oscillator. See LP_OSC is the source for the BASE_PCR_CLK that clocks the CGU itself and for BASE_SAFE_CLK that clocks a minimum of other logic in the device (like the watchdog timer) ...

Page 54

... NXP Semiconductors Configuration of the CGU0: choice can be made from the primary and secondary clock generators according to Figure 13. Fig 13. Structure of the clock generation scheme Any output generator (except for BASE_SAFE_CLK and BASE_PCR_CLK) can be connected to either a fractional divider (FDIV0: one of the outputs of the PLL or to LP_OSC/crystal oscillator directly ...

Page 55

... NXP Semiconductors generator. The RDET register keeps track of which clocks are active and inactive, and the appropriate ‘CLK_SEL’ values are masked and unmasked accordingly. Each clock detector can also generate interrupts at clock activation and deactivation so that the system can be notifi change in internal clock status. ...

Page 56

... NXP Semiconductors Triple output phases: clock outputs can be enabled by setting register P23EN to logic 1, thus giving three clocks with a 120 phase difference. In this mode all three clocks generated by the analog section are sent to the output dividers. When the PLL has not yet achieved lock the second and third phase output dividers run unsynchronized, which means that the phase relation of the output clocks is unknown ...

Page 57

... NXP Semiconductors CLOCK GENERATION UNIT clkout BASE_ICLK0_CLK clkout120 PLL clkout240 BASE_ICLK1_CLK Fig 15. Block diagram of the CGU1 6.16.3.1 Pin description The CGU1 module in the LPC2939 has the pins listed in Table 29. Symbol CLK_OUT 6.16.4 Reset Generation Unit (RGU) The RGU controls all internal resets. The key features of the Reset Generation Unit (RGU) are: • ...

Page 58

... NXP Semiconductors 6.16.4.1 Functional description Each reset output is defined as a combination of reset input sources including the external reset input pins and internal power-on reset, see table form a sort of cascade to provide the multiple levels of impact that a reset may have. The combined input sources are logically OR-ed together so that activating any of the listed reset sources causes the output to go active ...

Page 59

... NXP Semiconductors 6.16.5 Power Management Unit (PMU) This module enables software to actively control the system’s power consumption by disabling clocks not required in a particular operating mode. Using the base clocks from the CGU as input, the PMU generates branch clocks to the rest of the LPC2939. Output clocks branched from the same base clock are phase- and frequency-related ...

Page 60

... NXP Semiconductors Table 32. Legend: ‘1’ Indicates that the related register bit is tied off to logic HIGH, all writes are ignored ‘0’ Indicates that the related register bit is tied off to logic LOW, all writes are ignored ‘+’ Indicates that the related register bit is readable and writable ...

Page 61

... NXP Semiconductors Table 32. Legend: ‘1’ Indicates that the related register bit is tied off to logic HIGH, all writes are ignored ‘0’ Indicates that the related register bit is tied off to logic LOW, all writes are ignored ‘+’ Indicates that the related register bit is readable and writable ...

Page 62

... NXP Semiconductors 6.17.1 Functional description The Vectored Interrupt Controller routes incoming interrupt requests to the ARM processor. The interrupt target is configured for each interrupt request input of the VIC. The targets are defined as follows: • Target 0 is ARM processor FIQ (fast interrupt service) • ...

Page 63

... NXP Semiconductors 7. Limiting values Table 33. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Supply pins P total power dissipation tot V core supply voltage DD(CORE) V oscillator and PLL supply DD(OSC_PLL) voltage V 3.3 V ADC analog supply DDA(ADC3V3) voltage V 5.0 V ADC analog supply ...

Page 64

... NXP Semiconductors Table 33. Limiting values …continued In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter ESD V electrostatic discharge esd voltage [1] Based on package heat transfer, not device power consumption. [2] Peak current must be limited at 25 times average current. [3] For I/O Port 0, the maximum input voltage is defined by V ...

Page 65

... NXP Semiconductors 8. Static characteristics Table 34. Static characteristics DD(CORE) DD(OSC_PLL) DD(IO +85 C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise vj [1] specified. Symbol Parameter Supplies Core supply V core supply voltage DD(CORE) I core supply current ...

Page 66

... NXP Semiconductors Table 34. Static characteristics DD(CORE) DD(OSC_PLL) DD(IO +85 C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise vj [1] specified. Symbol Parameter V LOW-level input voltage IL V hysteresis voltage hys I HIGH-level input leakage LIH ...

Page 67

... NXP Semiconductors Table 34. Static characteristics DD(CORE) DD(OSC_PLL) DD(IO +85 C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise vj [1] specified. Symbol Parameter I LOW-level output current OL I HIGH-level short-circuit OHS output current I LOW-level short-circuit ...

Page 68

... NXP Semiconductors Table 35. ADC static characteristics DDA(ADC3V3) amb Symbol Parameter V voltage on pin VREFN VREFN V voltage on pin VREFP VREFP V analog input voltage IA Z input impedance i C analog input capacitance ia E differential linearity error D E integral non-linearity L(adj) E offset error O E gain error ...

Page 69

... NXP Semiconductors 1023 1022 1021 1020 1019 1018 7 code out offset error E O (1) Example of an actual transfer curve. (2) The ideal transfer curve. (3) Differential linearity error (E (4) Integral non-linearity (E L(adj) (5) Center of a step of the actual transfer curve. ...

Page 70

... NXP Semiconductors 8.1 Power consumption I DD(CORE) (mA) Fig 18 DD(CORE) (mA) Fig 19. I LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB Conditions active mode entered executing code from flash; core voltage 1.8 V; all amb peripherals enabled but not configured to run. ...

Page 71

... NXP Semiconductors I DD(CORE) (mA) Fig 20. 8.2 Electrical pin characteristics V (mV) Fig 21. Typical LOW-level output voltage versus LOW-level output current LPC2939_1 Preliminary data sheet 80 125 MHz 60 100 MHz 80 MHz 40 40 MHz 20 10 MHz Conditions: active mode entered executing code from flash; core voltage 1.8 V; all peripherals enabled but not confi ...

Page 72

... NXP Semiconductors V (V) Fig 22. Typical HIGH-level output voltage versus HIGH-level output current I I(pd Fig 23. Typical pull-down input current versus temperature LPC2939_1 Preliminary data sheet 3.5 OH 3.0 2.5 2.0 1.0 2.0 3 3.3 V. DD(IO 3 Rev. 01 — 11 June 2009 ARM9 microcontroller with CAN, LIN, and USB ...

Page 73

... NXP Semiconductors I I(pu Fig 24. Typical pull-up input current versus temperature LPC2939_1 Preliminary data sheet 100 Rev. 01 — 11 June 2009 ARM9 microcontroller with CAN, LIN, and USB = 2.7 V DD(IO) 3 temperature ( C) LPC2939 002aae692 85 © NXP B.V. 2009. All rights reserved. ...

Page 74

... NXP Semiconductors 9. Dynamic characteristics 9.1 Dynamic characteristics: I/O and CLK_OUT pins, internal clock, oscillators, PLL, and CAN Table 36. Dynamic characteristics DD(CORE) DD(OSC_PLL) DD(IO) ground; positive currents flow into the IC; unless otherwise specified. Symbol Parameter I/O pins t HIGH to LOW transition THL time t LOW to HIGH transition ...

Page 75

... NXP Semiconductors f ref(RO) (kHz) Fig 25. Low-power ring oscillator thermal characteristics LPC2939_1 Preliminary data sheet 520 510 500 490 480 Rev. 01 — 11 June 2009 ARM9 microcontroller with CAN, LIN, and USB 1.9 V 1 temperature ( C) LPC2939 002aae373 85 © NXP B.V. 2009. All rights reserved. ...

Page 76

... NXP Semiconductors 9.2 USB interface Table 37. Dynamic characteristics: USB pins (full-speed pF 1 Symbol Parameter t rise time r t fall time f t differential rise and fall time FRFM matching V output signal crossover voltage CRS t source SE0 interval of EOP FEOPT t source jitter for differential transition ...

Page 77

... NXP Semiconductors 9.3 Dynamic characteristics: I Table 38. Dynamic characteristic DD(CORE) DD(OSC_PLL) DD(IO) ground; positive currents flow into the IC; unless otherwise specified. Symbol Parameter t output fall time f(o) [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T temperature on wafer level. Cased products are tested at T test conditions to cover the specifi ...

Page 78

... NXP Semiconductors 9.5 Dynamic characteristics: flash memory and EEPROM Table 40 + amb V DDA(ADC3V3) Symbol N endu t ret t prog init t wr(pg) t fl(BIST) t a(clk) t a(A) [1] Number of program/erase cycles. Table 41 + amb V DDA(ADC3V3) Symbol f clk N endu t ret LPC2939_1 ...

Page 79

... NXP Semiconductors 9.6 Dynamic characteristics: external static memory Table 42. External static memory interface dynamic characteristics DD(CORE) DD(OSC_PLL) DD(IO) [1] ground. Symbol Parameter T clock cycle time CLCL t internal read access time a(R)int t internal write access time a(W)int Read cycle parameters t CS LOW to address valid ...

Page 80

... NXP Semiconductors CSLOEL OE/BLS Fig 28. External memory read access CS BLS Fig 29. External memory write access LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB t CSLAV t su(DQ OELAV BLSLAV OELOEH BLSLBLSH t CSLDV t BLSLBLSH t CSLBLSL t t CSLWEL ...

Page 81

... NXP Semiconductors 9.7 Dynamic characteristics: ADC Table 43. ADC dynamic characteristics DD(CORE) DD(OSC_PLL) DD(IO) [1] ground. Symbol Parameter 5.0 V ADC0 f ADC input frequency i(ADC) f maximum sampling rate s(max) t conversion time conv 3.3 V ADC1/2 f ADC input frequency i(ADC) f maximum sampling rate s(max) t conversion time conv [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T temperature on wafer level. Cased products are tested at T test conditions to cover the specifi ...

Page 82

... NXP Semiconductors core frequency (MHz) Fig 30. LPC2939 core operating frequency versus temperature for different core voltages core frequency (MHz) Fig 31. LPC2939 core operating frequency versus core voltage for different temperatures LPC2939_1 Preliminary data sheet 145 V = 1.95 V DD(CORE) 135 V = 1.8 V DD(CORE) 125 ...

Page 83

... NXP Semiconductors 10.2 Suggested USB interface solutions LPC29xx Fig 32. LPC2939 USB interface on a self-powered device LPC29xx Fig 33. LPC2939 USB interface on a bus-powered device LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB V DD(IO) USB_UP_LED USB_CONNECT SoftConnect switch R1 1.5 k USB_VBUS USB_D+ ...

Page 84

... NXP Semiconductors USB_RST1 USB_SCL1 USB_SDA1 USB_INT1 USB_D+1 USB_D 1 USB_UP_LED1 LPC293X USB_PPWR2 USB_OVRCR2 USB_PWRD2 USB_D+2 USB_D 2 USB_UP_LED2 Fig 34. LPC2939 USB OTG port configuration: USB port 1 OTG dual-role device, USB port 2 host LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB ...

Page 85

... NXP Semiconductors USB_UP_LED1 USB_D+1 USB_D 1 USB_PWRD1 USB_OVRCR1 USB_PPWR1 LPC293X USB_PPWR2 USB_OVRCR2 USB_PWRD2 USB_D+2 USB_D 2 USB_UP_LED2 Fig 35. LPC2939 USB OTG port configuration: USB port 1 host, USB port 2 host LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB V DD(IO ...

Page 86

... NXP Semiconductors USB_UP_LED1 USB_D+1 USB_D 1 USB_PWRD1 USB_OVRCR1 USB_PPWR1 LPC293X USB_UP_LED2 USB_CONNECT2 USB_D+2 USB_D 2 USB_VBUS2 Fig 36. LPC2939 USB OTG port configuration: USB port 2 device, USB port 1 host LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB V DD(IO ...

Page 87

... NXP Semiconductors 10.3 SPI signal forms SCKn (CPOL = 0) SCKn (CPOL = 1) CPHA = 1 CPHA = 0 Fig 37. SPI timing in master mode SCKn (CPOL = 0) SCKn (CPOL = 1) CPHA = 1 CPHA = 0 Fig 38. SPI timing in slave mode LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB SDOn MSB OUT ...

Page 88

... NXP Semiconductors 10.4 XIN_OSC input The input voltage to the on-chip oscillators is limited to 1 the oscillator is driven by a clock in slave mode recommended that the input be coupled through a capacitor with C = 100 pF. To limit the input voltage to the specified range, choose an additional i capacitor to ground C slave mode, a minimum of 200 mV RMS is needed ...

Page 89

... NXP Semiconductors 11. Package outline LQFP208; plastic low profile quad flat package; 208 leads; body 1 156 157 pin 1 index 208 DIMENSIONS (mm are the original dimensions) A UNIT max. 0.15 1.45 mm 1.6 0.25 0.05 1.35 Note 1. Plastic or metal protrusions of 0.25 mm maximum per side are not included. ...

Page 90

... NXP Semiconductors 12. Soldering of SMD packages This text provides a very brief insight into a complex technology. A more in-depth account of soldering ICs can be found in Application Note AN10365 “Surface mount reflow soldering description” . 12.1 Introduction to soldering Soldering is one of the most common methods through which packages are attached to Printed Circuit Boards (PCBs), to form electrical circuits ...

Page 91

... NXP Semiconductors 12.4 Reflow soldering Key characteristics in reflow soldering are: • Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to higher minimum peak temperatures (see reducing the process window • Solder paste printing issues including smearing, release, and adjusting the process window for a mix of large and small components on one board • ...

Page 92

... NXP Semiconductors Fig 41. Temperature profiles for large and small components For further information on temperature profiles, refer to Application Note AN10365 “Surface mount reflow soldering description” . LPC2939_1 Preliminary data sheet maximum peak temperature = MSL limit, damage level temperature minimum peak temperature ...

Page 93

... NXP Semiconductors 13. Abbreviations Table 46. Abbreviation ADC AF AHB AMBA APB BIST CAN CCO CISC DMA DSP DTL EMI EOP ETB ETM FDIV FIQ GPDMA GPIO LIN LSB LUT MAC MSB MSC MSCSS MTMR OHCI OTG PCR PHY PLL POR PWM QEI Q-SPI ...

Page 94

... NXP Semiconductors Table 46. Abbreviation SFSP SPI SSP TAP TCM TTL UART USB WDT 14. References [1] UM10316 — LPC29xx user manual. [2] ARM — ARM web site. [3] ARM-SSP — ARM primecell synchronous serial port (PL022) technical reference manual. [4] CAN — ISO 11898-1: 2002 road vehicles - Controller Area Network (CAN) - part 1: data link layer and physical signalling ...

Page 95

... NXP Semiconductors 15. Revision history Table 47. Revision history Document ID Release date LPC2939_1 20090611 LPC2939_1 Preliminary data sheet ARM9 microcontroller with CAN, LIN, and USB Data sheet status Change notice Preliminary data sheet - Rev. 01 — 11 June 2009 LPC2939 Supersedes - © NXP B.V. 2009. All rights reserved. ...

Page 96

... Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice ...

Page 97

... NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 3 Ordering information . . . . . . . . . . . . . . . . . . . . . 3 3.1 Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3 4 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4 5 Pinning information . . . . . . . . . . . . . . . . . . . . . . 5 5.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 5.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 5 5.2.1 General description 5.2.2 LQFP208 pin assignment . . . . . . . . . . . . . . . . . 5 6 Functional description . . . . . . . . . . . . . . . . . . 14 6.1 Architectural overview 6.2 ARM968E-S processor . . . . . . . . . . . . . . . . . . 14 6.3 On-chip flash memory system . . . . . . . . . . . . 15 6.4 On-chip static RAM 6.5 Memory map ...

Page 98

... NXP Semiconductors 6.15.5.5 Clock description . . . . . . . . . . . . . . . . . . . . . . 48 6.15.6 Timers in the MSCSS . . . . . . . . . . . . . . . . . . . 48 6.15.6.1 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 49 6.15.6.2 Clock description . . . . . . . . . . . . . . . . . . . . . . 49 6.15.7 Quadrature Encoder Interface (QEI 6.15.7.1 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 50 6.15.7.2 Clock description . . . . . . . . . . . . . . . . . . . . . . 50 6.16 Power, Clock and Reset control SubSystem (PCRSS 6.16.1 Clock description . . . . . . . . . . . . . . . . . . . . . . 51 6.16.2 Clock Generation Unit (CGU0 6.16.2.1 Functional description 6.16.2.2 PLL functional description . . . . . . . . . . . . . . . 55 6.16.2.3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 56 6.16.3 Clock generation for USB (CGU1 ...

Related keywords