uaa2082 NXP Semiconductors, uaa2082 Datasheet - Page 20

• Manufacturer Part Number: uaa2082
• Description: Advanced Pager Receiver
• Manufacturer: NXP Semiconductors

Philips Semiconductors
TEST INFORMATION
Tuning procedure for AC tests
1. Turn on the signal generator: f
2. Measure the IF with a counter connected to test pin TPI. Tune C16 to set the crystal oscillator to achieve f
3. Set the signal generator to nominal frequency (f
4. Tune C15 (oscillator output circuit) and C12 (frequency multiplier output) to obtain a peak audio voltage on pin TPI.
5. Tune C3 and C6 (RF input and mixer input) to obtain a peak audio voltage on pin TPI. When testing the mixer input
6. Check that the output signal on pin TPQ is within 3 dB in amplitude and at 90 ( 20 ) relative phase of the signal on
7. Check that data signal appears on output pin DO and proceed with the AC test.
AC test conditions
Table 4 Definitions for AC test conditions (see Table 5)
2000 Nov 15
Modulated test signal 1
Frequency
Deviation
Modulation 1200 baud pseudo random bit sequence
Rise time
Modulated test signal 2
Deviation
Modulation 400 Hz sine wave
Other definitions
f
f
f
P
P
P
P
1
2
3
f
SIGNAL
1
2
3
i(ref)
Advanced pager receiver
cs
Change the generator frequency to f
frequency f
crystal frequency is f
wave modulation, V
receiver is tuned, to ensure V
sensitivity, tune C23 instead of C3 and C6 (test circuit Fig.5).
pin TPI.
172.941 or 469.950 MHz
250 25 s (between 10% and 90% of final value)
frequency of signal generator 1
frequency of signal generator 2
frequency of signal generator 3
channel spacing (20 kHz)
maximum available power from signal generator 1 at the test board input
maximum available power from signal generator 2 at the test board input
maximum available power from signal generator 3 at the test board input
maximum available power at the test board input to give a Bit Error Rate (BER)
test signal 1, in the absence of interfering signals and under the conditions as specified in Chapters
“AC characteristics (173 MHz)” and “AC characteristics (470 MHz)”.
i(RF)
4.0 kHz
2.4 kHz
= 172.941 MHz, the crystal frequency is f
i(RF)
XTAL
= 1 mV (RMS). Note that the RF signal should be reduced in the following tests, as the
= 78.325 MHz.
o(IF)
gen
= 10 to 50 mV (p-p) on test pins TPI or TPQ.
= f
i(RF)
gen
= f
+ 4 kHz, no modulation, V
i(RF)
i(RF)
4 kHz and check that f
) and turn on the modulation deviation 4.0 kHz, 600 Hz square
20
DESCRIPTION
XTAL
= 57.647 MHz, while for f
i(RF)
IF
= 1 mV (RMS).
is also 4 kHz. For a received input
i(RF)
= 469.950 MHz, the
3
100
Product specification
for the modulated
UAA2082
IF
= 4 kHz,