tc58v64bft TOSHIBA Semiconductor CORPORATION, tc58v64bft Datasheet - Page 31
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tc58v64bft
Manufacturer Part Number
tc58v64bft
Description
64-mbit Bits Cmos Nand E2prom
Manufacturer
TOSHIBA Semiconductor CORPORATION
Datasheet
1.TC58V64BFT.pdf
(33 pages)
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Bad Block Test Flow
Invalid blocks (bad blocks)
do not use these bad blocks.
The device contains unusable blocks. Therefore, at the time of use, please check whether a block is bad and
Figure 26.
Block No. = Block No. + 1
* 1: No erase operation is allowed to detected bad blocks
Bad Block
Bad Block
No
Block, all bytes are not in the FFH state. Please don’t perform erase
operation to Bad Block.
Figure 27 shows the test flow for bad block detection. Bad blocks which are
detected by the test flow must be managed as unusable blocks by the
system.
isolated from the Bit line by the Select gate
Valid (Good) Block Number
At the time of shipment, all data bytes in a Valid Block are FFH. For Bad
Check if the device has any bad blocks after installation into the system.
A bad block does not affect the performance of good blocks because it is
The number of valid blocks at the time of shipment is as follows:
Block No. = 1024
Block No = 1
Read Check
Figure 27
Start
End
Pass
Yes
Fail
1014
MIN
Read Check: to verify all pages in the block
Bad Block * 1
TYP.
¾
with FF (Hex)
2001-10-24 31/33
MAX
1024
TC58V64BFT
Block
UNIT