lh28f004su-z9 Sharp Microelectronics of the Americas, lh28f004su-z9 Datasheet - Page 21

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lh28f004su-z9

Manufacturer Part Number
lh28f004su-z9
Description
Flash Memory
Manufacturer
Sharp Microelectronics of the Americas
Datasheet
4M (512K × 8) Flash Memory
AC Characteristics - Read Only Operations
AC Characteristics - Read Only Operations
NOTES:
1. See AC Input/Output Reference Waveforms for timing measurements, Figure 4.
2. OE
3. Sampled, not 100% tested.
NOTES:
1. See AC Input/Output Reference Waveforms for timing measurements, Figure 4.
2. OE
3. Sampled, not 100% tested.
SYMBOL
SYMBOL
V
t
t
V
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVQV
PHQV
GLQV
EHQZ
GLQX
GHQZ
AVQV
PHQV
GLQV
EHQZ
GLQX
GHQZ
AVAV
AVGL
ELQV
ELQX
AVAV
AVGL
ELQV
ELQX
t
t
CC
CC
OH
OH
    »
    »
may be delayed up to t
may be delayed up to t
= 3.3 V ± 0.3 V, T
= 2.85 V ± 0.15 V, T
Read Cycle Time
Address Setup to OE
Address to Output Delay
CE
RP
OE
CE
CE
OE
OE
Output Hold from Address, CE
OE
Read Cycle Time
Address Setup to OE
Address to Output Delay
CE
RP
OE
CE
CE
OE
OE
Output Hold from Address, CE
OE
»
»
»
»
»
»
»
»
»
»
»
»
»
»
»
»
to Output Delay
High to Output Delay
to Output in Low Z
to Output in High Z
to Output Delay
High to Output Delay
to Output in Low Z
to Output in High Z
to Output Delay
to Output in Low Z
to Output in High Z
change, whichever occurs first
to Output Delay
to Output in Low Z
to Output in High Z
change, whichever occurs first
PARAMETER
PARAMETER
A
ELQV
ELQV
= 20°C to +85°C
A
= -20°C to +85°C
- t
- t
GLQV
GLQV
»
»
Going Low
Going Low
after the falling edge of CE
after the falling edge of CE
»
»
or
or
MIN.
150
0
0
0
0
MIN.
190
0
0
0
0
1
1
    »
MAX.
    »
without impact on t
150
150
750
50
55
40
without impact on t
MAX.
190
190
900
65
70
55
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ELQV
ELQV
NOTE
.
NOTE
.
3
2
2
3
3
3
3
3
3
2
2
3
3
3
3
3
LH28F004SU-Z9
21

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