at28bv16 ATMEL Corporation, at28bv16 Datasheet - Page 2
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at28bv16
Manufacturer Part Number
at28bv16
Description
Battery-voltage Cmos
Manufacturer
ATMEL Corporation
Datasheet
1.AT28BV16.pdf
(8 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
at28bv16-25TI
Manufacturer:
TOSHIBA
Quantity:
363
Part Number:
at28bv16-25TI
Manufacturer:
ATMEL/爱特梅尔
Quantity:
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Absolute Maximum Ratings*
Description (Continued)
internally, freeing the microprocessor address and data
bus for other operations. Following the initiation of a write
cycle, the device will go to a busy state and automatically
clear and write the latched data using an internal control
timer. The end of a write cycle can be determined by
DATA polling of I/O
been detected, a new access for a read or a write can
begin.
Block Diagram
2-120
Temperature Under Bias................. -55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
7.
Once the end of a write cycle has
AT28BV16
CC
+ 0.6V
The CMOS technology offers fast access times of 250 ns
at low power dissipation. When the chip is deselected the
standby current is less than 50 A.
Atmel’s 28BV16 has additional features to ensure high
quality and manufacturability. The device utilizes error cor-
rection internally for extended endurance and for im-
proved data retention characteristics. An extra 32-bytes of
E
*NOTICE: Stresses beyond those listed under “Absolute Maxi-
2
PROM are available for device identification or tracking.
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indi-
cated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.