sab9083 NXP Semiconductors, sab9083 Datasheet - Page 4

• Manufacturer Part Number: sab9083
• Description: Multistandard Picture-in-picture Pip Controller
• Manufacturer: NXP Semiconductors

Philips Semiconductors
PINNING
1999 Nov 12
V
MU
V
V
V
V
V
DY
V
DV
V
DU
V
V
V
V
V
V
V
V
n.c.
V
n.c.
T5
T4
T3
T2
T1
T0
TC
V
V
V
V
TCLK
TM
TCBD
TCBC
TCBR
V
ref(B)(MA)
DDA(MF)
SSA(MA)
DDA(MA)
DDA(DA)
SSA(DA)
bias(DA)
ref(T)(DA)
ref(B)(DA)
DDD(DA)
SSD(DA)
SSD(P1)
DDD(P1)
SSD(T1)
SSD(T2)
DDD(RP)
SSD(T3)
DDD(RL)
SSD(RL)
SSD(RM)
DDD(RM)
SSD(T4)
Multistandard Picture-In-Picture (PIP)
controller
SYMBOL
to V
SSD(T7)
21 to 29
48 to 51
PIN
10
11
12
13
14
15
16
17
18
19
20
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
1
2
3
4
5
6
7
8
9
TYPE
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
O
O
O
S
S
S
S
S
S
S
S
S
S
S
S
S
S
S
S
S
S
I
I
I
I
I
I
I
analog bottom reference voltage for main channel ADCs
analog U input for main channel
analog supply voltage for main channel front-end buffers
analog ground for main channel ADCs
analog supply voltage for main channel ADCs
analog supply voltage for DACs
analog ground for DACs
analog Y output of DAC
input/output analog bias reference voltage for DACs
analog V output of DAC
input/output analog top reference voltage for DACs
analog U output of DAC
analog bottom reference voltage for DACs
digital supply voltage for DACs
digital ground for DACs
digital ground for periphery
digital supply voltage for periphery
digital ground for test
digital ground for test
digital supply voltage for memory periphery
not connected
digital ground for test
not connected
test data input/output bit 5 (CMOS levels)
test data input/output bit 4 (CMOS levels)
test data input/output bit 3 (CMOS levels)
test data input/output bit 2 (CMOS levels)
test data input/output bit 1 (CMOS levels)
test data input/output bit 0 (CMOS levels)
test control input (CMOS levels)
digital supply voltage for memory logic
digital ground for memory logic
digital ground for memory core
digital supply voltage for memory core
test clock input (CMOS levels)
test mode input (CMOS levels)
test control block data input (CMOS levels)
test control block clock input (CMOS levels)
test control block reset input (CMOS levels)
digital ground for test
4
DESCRIPTION
Preliminary specification
SAB9083