nb6n11s ON Semiconductor, nb6n11s Datasheet - Page 3

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nb6n11s

Manufacturer Part Number
nb6n11s
Description
3.3 V 1 2 Anylevel Tm Input To Lvds Fanout Buffer /translator
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
3. JEDEC standard multilayer board − 1S2P (1 signal, 2 power) with 8 filled thermal vias under exposed pad.
Table 3. MAXIMUM RATINGS
Symbol
V
V
I
I
T
T
q
q
T
IN
OSC
stg
sol
A
JA
JC
CC
IN
Positive Power Supply
Positive Input
Input Current Through R
Output Short Circuit Current
Line−to−Line (Q to Q)
Line−to−End (Q or Q to GND)
Operating Temperature Range
Storage Temperature Range
Thermal Resistance (Junction−to−Ambient) (Note 3)
Thermal Resistance (Junction−to−Case)
Wave Solder
Table 2. ATTRIBUTES
2. For additional information, see Application Note AND8003/D.
ESD Protection
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2)
Flammability Rating
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Parameter
T
(50 W Resistor)
Characteristics
Pb−Free
http://onsemi.com
Oxygen Index: 28 to 34
Charged Device Model
Pb
NB6N11S
Human Body Model
GND = 0 V
GND = 0 V
Static
Surge
Q or Q to GND
Q to Q
QFN−16
0 lfpm
500 lfpm
1S2P (Note 3)
Machine Model
3
Condition 1
QFN−16
Pb Pkg
UL 94 V−0 @ 0.125 in
V
Continuous
Continuous
QFN−16
QFN−16
QFN−16
IN
≤ V
225 Devices
Condition 2
> 200 V
> 2 kV
> 1 kV
CC
Value
Pb−Free Pkg
1
−65 to +150
−40 to +85
Rating
41.6
35.2
265
265
3.8
3.8
4.0
35
70
12
24
°C/W
°C/W
°C/W
Unit
mA
mA
mA
°C
°C
°C
V
V

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