N74F273AD,602 NXP Semiconductors, N74F273AD,602 Datasheet - Page 5

• Manufacturer Part Number: N74F273AD,602
• Description: IC FLIP FLOP TRI-ST OCTAL 20SOIC
• Manufacturer: NXP Semiconductors
• Series: 74Fr
• Type: D-Type Busr

Specifications of N74F273AD,602

• Function: Master Reset
• Output Type: Non-Inverted
• Number Of Elements: 1
• Number Of Bits Per Element: 8
• Frequency - Clock: 170MHz
• Delay Time - Propagation: 7ns
• Trigger Type: Positive Edge
• Current - Output High, Low: 1mA, 20mA
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 20-SOIC (7.5mm Width)
• Logic Family: F
• Technology: Bipolar
• Number Of Bits: 8
• Number Of Elements: 1
• Clock-edge Trigger Type: Positive-Edge
• Polarity: Non-Inverting
• Operating Supply Voltage (typ): 5V
• Package Type: SO
• Propagation Delay Time: 10ns
• Low Level Output Current: 20mA
• High Level Output Current: -1mA
• Frequency (max): 125MHz
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 20
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 935053560602; N74F273AD; N74F273AD

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. To reduce the effect of external noise during test.
4. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
AC CHARACTERISTICS FOR ’F273A
1996 Mar 12
SYMBOL
Octal D flip–flop
SYMBOL
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
f
t
t
t
MAX
PLH
PHL
PHL
V
V
V
I
I
I
I
OS
CC
OH
I
IH
OL
IL
IK
I
Maximum clock frequency
Propagation delay
CP to Qn
Propagation delay
MR to Qn
High-level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Short–circuit output current
Supply current (total)
PARAMETER
CC
= 5V, T
PARAMETER
OS
tests should be performed last.
amb
= 25 C.
4
MR & CP
inputs
other
inputs
I
I
CCH
CCL
WAVEFORM
1
1
2
V
V
V
V
V
V
V
V
V
V
V
V
CC
IH
CC
IH
CC
IH
CC
CC
CC
CC
CC
CC
= 4.5V
= MIN, I
= MIN, I
OS
= MIN, V
= MIN, V
= MIN, V
= MIN, I
= 0.0V, V
= MAX, V
= MAX, V
= MAX
= MAX
5
, the use of high-speed test apparatus and/or sample-and-hold
3
Min
150
, I
3.5
5.0
5.0
OH
OH
CONDITIONS
I
OH
IL
IL
IL
= I
I
I
I
= 7.0V
= MAX
= MAX
= 2.7V
= 0.5V
= 0.0V
= MAX,
= MAX,
IK
T
TEST
= MAX
V
amb
R
C
CC
L
L
= 500
= 50pF
Typ
170
= +5.0V
5.0
7.0
7.0
= +25 C
3
,
1
10%V
5%V
10%V
10%V
5%V
5%V
Max
8.0
9.5
9.0
LIMITS
CC
CC
CC
CC
CC
CC
T
MIN
V
amb
2.5
2.7
2.5
2.7
-60
Min
125
3.0
4.5
5.0
CC
R
C
= 0 C to +70 C
= +5.0V 10%
L
L
= 50pF
= 500
LIMITS
–0.73
TYP
0.30
0.30
3.4
3.4
24
27
2
Max
10.0
Product specification
9.0
9.5
74F273A
MAX
0.50
0.50
-150
-1.2
100
–20
20
38
43
UNIT
MHz
UNIT
ns
ns
mA
mA
mA
V
V
V
V
V
V
V
A
A
A