ST62E25C ST Microelectronics, ST62E25C Datasheet - Page 66

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ST62E25C

Manufacturer Part Number
ST62E25C
Description
(ST62T15C / ST62T25C) 8-BIT OTP/EPROM MCUs WITH A/D CONVERTER
Manufacturer
ST Microelectronics
Datasheets

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ST6215C/ST6225C
OPERATING CONDITIONS (Cont’d)
11.3.2 Operating Conditions with Low Voltage Detector (LVD)
Subject to general operating conditions for V
Notes:
1. LVD typical data are based on T
2. The minimum V
3. Data based on characterization results, not tested in production.
Figure 39. LVD Threshold Versus V
Figure 40. Typical LVD Thresholds Versus
Temperature for OTP devices
66/105
1
DEVICE UNDER
V
V
V
Vt
t
Thresholds [V]
4.2
3.8
3.6
g(VDD)
Symbol
IN THIS AREA
IT+
IT-
hys
4
POR
-40°C
RESET
f
OSC
Reset release threshold
(V
Reset generation threshold
(V
LVD voltage threshold hysteresis
V
Filtered glitch delay on V
DD
DD
DD
8
4
0
[MHz]
2.5
rise time rate
DD
rise)
fall)
25°C
rise time rate is needed to insure a correct device power-on and LVD reset. Not tested in production.
Parameter
T [°C]
3
2)
A
95°C
=25°C. They are given only as design guidelines and are not tested.
DD
3.5
3)
V
V
Vdd up
Vdd down
IT+
IT-
DD
V
IT-
and f
3.6
125°C
V
Not detected by the LVD
DD
4
IT+
OSC
, f
-V
OSC
IT-
3)
Conditions
, and T
Figure
Temperature for ROM devices
4.5
Thresholds [V]
4.2
3.8
3.6
4
-40°C
A
.
41.
5
Typical
25°C
Min
3.9
3.6
5.5
50
T [°C]
LVD
Typ
4.1
3.8
300
30
6
1)
95°C
thresholds
FUNCTIONALITY
NOT GUARANTEED
IN THIS AREA
FUNCTIONAL AREA
SUPPLY
VOLTAGE [V]
Max
4.3
700
V
V
4
Vdd up
Vdd down
IT+
IT-
125°C
mV/s
Unit
mV
ns
V
vs.

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