DS21Q58 Maxim Integrated Products, DS21Q58 Datasheet - Page 3

• Manufacturer Part Number: DS21Q58
• Description: Dallas Semiconductor
• Manufacturer: Maxim Integrated Products

FAILURE RATE:
Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT
rate is related to MTTF by:
The calculated failure rate for this device/process is:
The parameters used to calculate this failure rate are as follows:
The reliability data follows. A the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available.
Device Information:
ELECTRICAL CHARACTERIZATION
DESCRIPTION
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
LATCH-UP
LATCH-UP
OPERATING LIFE
DESCRIPTION
HIGH VOLTAGE LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
Process:
Passivation:
Die Size:
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
FAILURE RATE:
Cf: 60%
DATE CODE
0418
0418
0418
0418
0418
0418
0418
DATE CODE
0310
0332
0336
0402
0418
MTTF (YRS): 34521
Ea: 0.7
E6H-2P2M,HPVt,TCZ ALOCOS:GOI
Passivation w/OxyNitride-Nov. 4% PSG
416 x 405
1
Aluminum / 1% Silicon / 0.5% Copper
150 Å
CONDITION
EOS/ESD S5.1 HBM 500 VOLTS
EOS/ESD S5.1 HBM 1000 VOLTS
EOS/ESD S5.1 HBM 2000 VOLTS
EOS/ESD S5.1 HBM 4000 VOLTS
EOS/ESD S5.1 HBM 8000 VOLTS
JESD78, I-TEST 125C
JESD78, Vsupply TEST 125C
CONDITION
125C, 6.0 VOLTS
125C, 5.25 VOLTS
125C, 5.25 VOLTS
125C, 3.5 VOLTS
125C, 5.0 VOLTS
MTTF (YRS): 34521
B: 0
FITS: 3.3
Tu: 25
FITS: 3.3
°C
READPOINT
1
1
1
1
1
READPOINT
1000
1000
1000
1000
192
HRS
PUL'S
PUL'S
PUL'S
PUL'S
PUL'S
HRS
HRS
HRS
HRS
Vu: 5.5
Total:
Total:
QUANTITY
QUANTITY
Volts
80
77
77
45
77
3
3
3
3
3
6
6
FAILS
FAILS
0
0
0
3
3
0
0
6
0
0
0
0
0
0