DS21Q58 Maxim Integrated Products, DS21Q58 Datasheet
DS21Q58
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DS21Q58 Summary of contents
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... RELIABILITY REPORT FOR DS21Q58, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com ph: 972-371-3739 fax: 972-371-6016 06/01/04 ...
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... Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by X/(ts * AfV * AfT * Chi-Sq statistical upper limit N = Life test sample size DS21Q58, Rev B1 ...
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Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this ...