MA5104 Zarlink Semiconductor, MA5104 Datasheet
MA5104
Related parts for MA5104
MA5104 Summary of contents
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This product is obsolete. This information is available for your convenience only. For more information on Zarlink’s obsolete products and replacement product lists, please visit http://products.zarlink.com/obsolete_products/ ...
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... RADIATION HARD 4096 x 1 BIT STATIC RAM The MA5104 4k Static RAM is configured as 4096 x 1 bits and manufactured using CMOS-SOS high performance, radiation hard technology. The device has separate input and output terminals controlled by Chip Select and Write Enable. The design uses a 6 transistor cell and has full static operation with no clock or timing strobe required ...
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... MA5104 CHARACTERISTICS AND RATINGS Symbol Parameter V Supply Voltage CC V Input Voltage I T Operating Temperature A T Storage Temperature S Figure 3: Absolute Maximum Ratings Notes for Tables 4 and 5: 1. Characteristics apply to pre radiation at T radiation with 10% (characteristics at higher radiation levels available on request). ...
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... Rad(Si) total dose radiation A DD Conditions Min Figure 8: Capacitance Min Max Units 135 - ns - 135 ns - 135 Min Max Units 135 - Typ. Max. Units MA5104 3 ...
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... MA5104 Symbol Parameter F Basic Functionality T Subgroup Definition 1 Static characteristics specified in Tables 4 and Static characteristics specified in Tables 4 and 5 at +125 C 3 Static characteristics specified in Tables 4 and Functional characteristics specified in Table Functional characteristics specified in Table 9 at +125 C ...
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... Address Vaild prior to or coincident with CS transition low. ADDRESS DATA OUT high for Read Cycle. 2. Device is continually selected. CS low. T AVAVR T AVQV T ELQV T ELQX HIGH Figure 11a: Read Cycle 1 T AVAVR T AVQV Figure 11b: Read Cycle 2 T AXQX T EHQZ DATA VALID T AXQX DATA VALID MA5104 5 ...
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... MA5104 ADDRESS T WE HIGH DATA OUT IMPEDANCE DATA must be high during all address transitions write occurs during the overlap ( measured from either going high or CE going low, whichever is the earlier, to the end WHAV of the write cycle. ...
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... Typ 0.300 Typ. 5.38 0.175 - Max 0.225 A1 2 0.060 A2 3 0.023 0.014 A3 4 Top 0.910 A4 5 View - Dout 7 0.212 8 WE 0.326 9 Vss 0.050 0.060 MA5104 18 Vdd A10 12 A11 11 Din ...
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... MA5104 Figure 14: 24-Lead Ceramic Flatpack (Solder Seal) - Package Style Pin 1 Vdd A10 17 A11 16 Din Inches Ref Min. Nom 0.026 - b 0.015 - c 0.003 - D 0.590 - e - 0.050 L 0.265 - M 0.395 - Me 0. 0.005 ...
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... Direct Direct 5V 5V MA5104 Dy na mic Ra dia t ion LOAD 5V F12 F13 5V F11 5V F10 ...
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... MA5104 RADIATION TOLERANCE Total Dose Radiation Testing For product procured to guaranteed total dose radiation levels, each wafer lot will be approved when all sample devices from each lot pass the total dose radiation test. The sample devices will be subjected to the total dose ...
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... Tel: (01793) 518527/518566 Fax: (01793) 518582 These are supported by Agents and Distributors in major countries world-wide. © GEC Plessey Semiconductors 1995 Publication No. DS3580-3.2 April 1995 TECHNICAL DOCUMENTATION - NOT FOR RESALE. PRINTED IN UNITED KINGDOM. MA5104 QA/QCI Process (See Section 9 Part 4) Test Process (See Section 9 Part 3) ...