ADC1207S080 NXP Semiconductors, ADC1207S080 Datasheet - Page 13

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ADC1207S080

Manufacturer Part Number
ADC1207S080
Description
Single 12 bits ADC
Manufacturer
NXP Semiconductors
Datasheet

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NXP Semiconductors
11. Definitions
ADC1207S080_2
Product data sheet
11.1.1
11.1.2
11.1 Static parameters
11.2 Dynamic parameters
Integral Non-Linearity (INL)
It is defined as the deviation of the transfer function from a best fit straight line (linear
regression computation). The INL of the code i is obtained from the equation:
where: S corresponds to the slope of the ideal straight line (code width); i corresponds to
the code value; V
Differential Non-Linearity (DNL)
It is the deviation in code width from the value of 1 LSB.
where: V
Figure 7
conforming to coherent sampling (f/f
samples, M and N being relatively prime), and digitized by the ADC under test.
INL i
DNL i
Fig 7.
magnitude
=
i
shows the spectrum of a single tone full-scale input sine wave with frequency f,
=
Single tone spectrum of full-scale input sine wave with frequency f
is the input voltage; i from 0 to (2
V
----------------------------------------- -
V
--------------------------------------- -
i
i
i
i
+
i
Single 12 bits ADC, up to 80 MHz with direct/ultra high IF sampling
V
1
is the input voltage.
S
S
i
ideal
V
Rev. 02 — 7 August 2008
i
a
1
i
s
= M/N, with M number of cycles and N number of
a
2
n
2).
frequency
a
3
s
SFDR
ADC1207S080
a
© NXP B.V. 2008. All rights reserved.
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