ACS00MS Intersil Corporation, ACS00MS Datasheet - Page 4

• Manufacturer Part Number: ACS00MS
• Description: Radiation Hardened Quad 2-input NAND Gate
• Manufacturer: Intersil Corporation

NOTE:
NOTE:
NOTE:
NOTE:
1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a series resistor of 500Ω ±5%.
1. Each pin except VCC and GND will have a series resistor of 47kΩ ±5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
Initial Test (Preburn-In)
Interim Test 1 (Postburn-In)
Interim Test 2 (Postburn-In)
PDA
Interim Test 3 (Post-Burn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
CONFORMANCE GROUP
Group E Subgroup 2
STATIC BURN-IN 1 (Note 1)
STATIC BURN-IN 2 (Note 1)
DYNAMIC BURN-IN (Note 1)
Irradiation Circuit (Note 1)
CONFORMANCE GROUPS
OPEN
FUNCTION
-
-
-
Subgroup B-5
Subgroup B-6
1, 2, 4, 5, 7, 9, 10,
METHOD
TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25
TABLE 8. BURN-IN TEST CONNECTIONS (+125
5005
GROUND
12, 13
7
7
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Specifications ACS00MS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
3, 6, 8, 11
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
OPEN
PRE RAD
1, 7, 9
1/2 VCC = 3V ±0.5V
3, 6, 8, 11
3, 6, 8, 11
3, 6, 8, 11
TEST
4
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
GROUND
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
VCC = 6V ±0.5V
10, 12, 13, 14
o
7
1, 2, 4, 5, 9,
C < TA < 139
14
14
o
C, ±5
PRE RAD
o
o
C)
C)
1, 9
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
1, 2, 4, 5, 9, 10, 12, 13, 14
1, 2, 4, 5, 9,
10, 12, 13
50kHz
READ AND RECORD
VCC = 5V ±0.5V
-
-
Spec Number
OSCILLATOR
Table 4 (Note 1)
POST RAD
25kHz
-
-
-
518813