N74F367D,602 NXP Semiconductors, N74F367D,602 Datasheet - Page 5

• Manufacturer Part Number: N74F367D,602
• Description: IC BUFFER DVR HEX N-INV 16SOICN
• Manufacturer: NXP Semiconductors
• Series: 74Fr

Specifications of N74F367D,602

• Logic Type: Buffer/Line Driver, Non-Inverting
• Package / Case: 16-SOIC (3.9mm Width)
• Number Of Elements: 2
• Number Of Bits Per Element: 2, 4 (Hex)
• Current - Output High, Low: 15mA, 64mA
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Logic Family: N74F
• Number Of Channels Per Chip: 6
• Polarity: Non-Inverting
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 4.5 V
• Maximum Operating Temperature: 70 C
• Mounting Style: SMD/SMT
• High Level Output Current: - 15 mA
• Low Level Output Current: 64 mA
• Minimum Operating Temperature: 0 C
• Number Of Lines (input / Output): 8 / 6
• Output Type: 3-State
• Propagation Delay Time: 5 ns
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 568-1730-5; 933756800602; N74F367D

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
NOTES:
AC ELECTRICAL CHARACTERISTICS
2004 Jan 30
SYMBOL
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
SYMBOL
t
t
t
t
t
t
I
IH
IL
OZH
OZL
OS
CC
PLH
PHL
PZH
PZL
PHZ
PLZ
Hex buffer/driver
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter tests, I
O
OH
O
OL
IK
HIGH level output voltage
HIGH-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
HIGH-level input current
LOW-level input current
Off-state output current,
HIGH-level voltage applied
Off-state output current,
LOW-level voltage applied
Short-circuit output current
Supply current (total)
Propagation delay
I
Output Enable time
to HIGH or LOW level
Output Disable time
from HIGH to LOW level
n
to Y
n
PARAMETER
PARAMETER
PARAMETER
CC
= 5 V, T
amb
OS
3
= 25 C.
tests should be performed last.
I
I
I
CCH
CCL
CCZ
TEST CONDITIONS
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
V
V
V
V
V
IH
V
CC
CC
IH
CC
CC
CC
CC
IH
= MIN; I
= MIN; I
= MIN; V
= MIN; V
= MIN; V
= MIN; I
V
V
V
V
TEST CONDITIONS
TEST CONDITIONS
V
CC
CC
CC
CC
OS
V
CC
5
OH
CC
OH
= MAX; V
, the use of high-speed test apparatus and/or sample-and-hold
= MAX; V
OL
= MAX; V
= MAX; V
IL
IL
IL
IL
IL
IL
= 0 V; V
V
V
= –15 mA
MIN
= MIN; I
CC
CC
C
= –3 mA
2.5
2.5
3.0
3.0
2.0
2.0
= MAX;
= MAX;
= MAX;
= MAX
L
= MAX
= MAX
= 50 pF; R
T
V
amb
I
O
CC
O
I
I
= 7.0 V
I
= 2.7 V
= 0.5 V
= 0.5 V
= I
= 2.7 V
TYP
= +5.0 V
= +25 C
4.5
5.5
5.5
6.5
4.5
4.0
IK
1
1
L
= 500
10% V
10% V
10% V
5% V
5% V
5% V
MAX
6.5
7.0
7.5
8.5
6.5
6.5
CC
CC
CC
CC
CC
CC
LIMITS
T
–100
MIN
C
2.4
2.7
2.0
2.0
amb
–
–
–
–
–
–
–
–
–
–
–
L
V
MIN
2.0
2.0
3.0
3.0
2.0
2.0
CC
= 50 pF; R
= –55 C to +125 C
= +5.0 V
LIMITS
–0.73
TYP
0.42
3.3
25
47
35
–
–
–
–
–
–
–
–
–
–
2
L
= 500
MAX
10%
7.0
7.5
8.5
9.0
7.0
7.0
MAX
–225
0.55
0.55
–1.2
100
–20
–50
20
35
62
48
50
74F367
–
–
–
–
Product data
UNIT
UNIT
mA
mA
mA
mA
ns
ns
ns
ns
ns
ns
V
V
V
V
V
V
V
A
A
A
A
A