74HC541DB,112 NXP Semiconductors, 74HC541DB,112 Datasheet - Page 16
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74HC541DB,112
Manufacturer Part Number
74HC541DB,112
Description
IC BUFF/DVR TRI-ST 8BIT 20SSOP
Manufacturer
NXP Semiconductors
Series
74HCr
Datasheets
1.74HCT4046ADB112.pdf
(19 pages)
2.74HCT4046ADB112.pdf
(23 pages)
3.74HCT541PW118.pdf
(7 pages)
Specifications of 74HC541DB,112
Package / Case
20-SSOP
Logic Type
Buffer/Line Driver, Non-Inverting
Number Of Elements
1
Number Of Bits Per Element
8
Current - Output High, Low
7.8mA, 7.8mA
Voltage - Supply
2 V ~ 6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Logic Family
74HC
Number Of Channels Per Chip
8
Polarity
Non-Inverting
Supply Voltage (max)
6 V
Supply Voltage (min)
2 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
High Level Output Current
- 7.8 mA
Input Bias Current (max)
8 uA
Low Level Output Current
7.8 mA
Minimum Operating Temperature
- 40 C
Output Type
3-State
Propagation Delay Time
10 ns
Number Of Lines (input / Output)
8 / 8
Logical Function
Buffer/Line Driver
Number Of Elements
1
Number Of Channels
8
Number Of Inputs
8
Number Of Outputs
8
Operating Supply Voltage (typ)
5V
Package Type
SSOP
Operating Supply Voltage (max)
6V
Operating Supply Voltage (min)
2V
Quiescent Current
8uA
Technology
CMOS
Pin Count
20
Mounting
Surface Mount
Operating Temp Range
-40C to 125C
Operating Temperature Classification
Automotive
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-2710-5
935180350112
935180350112
Philips Semiconductors
HCMOS family characteristics
FAMILY SPECIFICATIONS
AC CHARACTERISTICS
The “AC CHARACTERISTICS” table lists the guaranteed
limits when a device is tested under the conditions given in
the AC Test Circuits and Waveforms section.
TEST CIRCUITS
Good high-frequency wiring practices should be used in
test circuits. Capacitor leads should be as short as
possible to minimize ripples on the output waveform
transitions and undershoot. Generous ground metal
(preferably a ground-plane) should be used for the same
reasons. A V
decoupling capacitor should be provided
CC
at the test socket, also with short leads. Input signals
should have rise and fall times of 6 ns, a signal swing of
0 V to V
for 74HC and 0 V to 3 V for 74HCT; a 1.0 MHz
CC
square wave is recommended for most propagation delay
tests. The repetition rate must be increased for testing
f
. Two pulse generators are usually required for testing
max
such parameters as set-up time, hold time and removal
time. f
is also tested with 6 ns input rise and fall times,
max
with a 50% duty factor, but for typical f
as high as
max
60 MHz, there are no constraints on rise and fall times.
March 1988
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