AD7908 Analog Devices, AD7908 Datasheet - Page 10

• Manufacturer Part Number: AD7908
• Description: 8-Channel, 1 MSPS, 8-Bit ADC with Sequencer in 20-Lead TSSOP
• Manufacturer: Analog Devices

Specifications of AD7908

• Resolution (bits): 8bit
• # Chan: 8
• Sample Rate: 1MSPS
• Interface: Ser,SPI
• Analog Input Type: SE-Uni
• Ain Range: Uni (Vref),Uni (Vref) x 2
• Adc Architecture: SAR
• Pkg Type: SOP

AD7908/AD7918/AD7928
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
AV
V
Analog Input Voltage to AGND
Digital Input Voltage to AGND
Digital Output Voltage to AGND
REF
Input Current to Any Pin Except
Operating Temperature Range
Junction Temperature
TSSOP Package, Power Dissipation
Lead Temperature, Soldering
ESD
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Transient currents of up to 100 mA do not cause SCR latch-up.
DRIVE
A
Supplies
Commercial (B Version)
Storage Temperature Range
Automotive Temperature Range
θ
θ
Vapor Phase (60 sec)
Infrared (15 sec)
DD
= 25°C, unless otherwise noted.
IN
JA
JC
to AGND
to AGND
to AGND
Thermal Impedance
Thermal Impedance
1
Rating
−0.3 V to +7 V
−0.3 V to AV
−0.3 V to AV
−0.3 V to +7 V
−0.3 V to AV
−0.3 V to AV
±10 mA
−40°C to +85°C
−65°C to +150°C
−40°C to +125°C
150°C
450 mW
143°C/W (TSSOP)
45°C/W (TSSOP)
215°C
220°C
1.5 kV
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. D | Page 10 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.