CR6929 NXP Semiconductors, CR6929 Datasheet - Page 4

• Manufacturer Part Number: CR6929
• Manufacturer: NXP Semiconductors

Philips Semiconductors
Components used in test-circuit (see Fig.3)
Test equipment used in test-circuit (see Fig.3)
1998 Sep 21
handbook, full pagewidth
C1
C2
C3
R1
R2
R3
Pulse generator
Power supply
FET probe
Sampling oscilloscope
Triple video driver hybrid amplifier
Speed-up circuit (R1, C1; R2, C2) ensures flat gain over the whole frequency range.
COMPONENT
EQUIPMENT
input
50
GENERATOR
variable capacitor
variable capacitor
chip capacitor and electrolytic capacitor
resistor
resistor
resistor
Le Croy; model 9210 with unit 9211
Philips; model PM5785B (125 MHz) with internal DC offset
Philips; model PE1542, 80 V
Philips; model PM8943, attenuation 100 : 1
Tektronix; model 11801B, sampling head SD26
PULSE
R3
Fig.3 Test-circuit and block diagram.
C1
R1
DESCRIPTION
(optional)
FIXTURE
SUPPLY
POWER
R level
CR6929
TEST
C2
R2
supply
4
1, 5, 9
TYPE DESCRIPTION
C3
CR6929
PROBE
FET
V S
2, 6, 10
4, 8
3, 7,11
OSCILLOSCOPE
SAMPLING
10 to 160 pF (typ. 50 pF)
10 to 160 pF (typ. 82 pF)
10 nF and 4.7 F; 160 V
275
62
50
C L
output
MGR529
VALUE
Product specification
CR6929