GAL26CV12B-15LJ Lattice, GAL26CV12B-15LJ Datasheet - Page 12

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GAL26CV12B-15LJ

Manufacturer Part Number
GAL26CV12B-15LJ
Description
SPLD - Simple Programmable Logic Devices HI PERF E2CMOS PLD
Manufacturer
Lattice
Datasheet

Specifications of GAL26CV12B-15LJ

Logic Family
GAL
Number Of Macrocells
12
Maximum Operating Frequency
83.3 MHz
Number Of Programmable I/os
12
Delay Time
15 ns
Operating Supply Voltage
5 V
Supply Current
130 mA
Maximum Operating Temperature
+ 75 C
Minimum Operating Temperature
0 C
Package / Case
PLCC-28
Mounting Style
SMD/SMT
Supply Voltage (max)
5.25 V
Supply Voltage (min)
4.75 V
Lead Free Status / Rohs Status
No

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3-state levels are measured 0.5V from steady-state active
level.
GAL26CV12 Output Load Conditions (see figure)
f
Switching Test Conditions
Input Pulse Levels
Input Rise and
Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
max Definitions
Test Condition
A
B
C
f
Active High
Active Low
Active High
Active Low
max with External Feedback 1/(
Note: fmax with external feedback is cal-
culated from measured tsu and tco.
Note: fmax with no feedback may be less
than 1/(twh + twl). This is to allow for a
clock duty cycle of other than 50%.
LOGIC
ARRAY
L O G I C
A R R A Y
t
su +
f
max with No Feedback
t
s u
t
h
B-10/-15/-20
C-7/-10/-15
300Ω
300Ω
300Ω
R
1
R EG I S T E R
REGISTER
C L K
CLK
390Ω
390Ω
390Ω
390Ω
390Ω
1.5ns 10% – 90%
R
3ns 10% – 90%
2
t
t
GND to 3.0V
c o
See Figure
su+
1.5V
1.5V
t
co)
50pF
50pF
50pF
5pF
5pF
C
L
11
FROM OUTPUT (O/Q)
UNDER TEST
Specifications GAL26CV12
*C
Note: tcf is a calculated value, derived by sub-
tracting tsu from the period of fmax w/internal
feedback (tcf = 1/fmax - tsu). The value of tcf is
used primarily when calculating the delay from
clocking a register to a combinatorial output
(through registered feedback), as shown above.
For example, the timing from clock to a combi-
natorial output is equal to tcf + tpd.
L
f
INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
max with Internal Feedback 1/(
LOGIC
ARRAY
R
2
t
cf
t
+5V
pd
REGISTER
CLK
R
1
t
su+
C *
L
t
TEST POINT
cf)

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