LH28F008SCN-V85 Sharp Electronics, LH28F008SCN-V85 Datasheet - Page 31

• Manufacturer Part Number: LH28F008SCN-V85
• Manufacturer: Sharp Electronics

Specifications of LH28F008SCN-V85

• Cell Type: NOR
• Density: 8Mb
• Access Time (max): 85ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 20b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: 0C to 70C
• Package Type: SOP
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 1M
• Supply Current: 50mA
• Mounting: Surface Mount
• Pin Count: 44
• Lead Free Status / Rohs Status: Not Compliant

6.2.5 AC CHARACTERISTICS - WRITE OPERATION
NOTES :
1. Read timing characteristics during block erase, byte write
2. Sampled, not 100% tested.
3. Refer to Table 3 for valid A
4. V
SYMBOL
•
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVAV
PHWL
ELWL
WLWH
PHHWH
VPWH
AVWH
DVWH
WHDX
WHAX
WHEH
WHWL
WHRL
WHGL
QVVL
QVPH
V
CC
and lock-bit configuration operations are the same as
during read-only operations. Refer to Section 6.2.4 "AC
CHARACTERISTICS" for read-only operations.
byte write, or lock-bit configuration.
should be held at V
byte write, or lock-bit configuration success (SR.1/3/4/5 = 0).
PP
= 5.0±0.25 V, 5.0±0.5 V, T
should be held at V
Write Cycle Time
RP# High Recovery to WE#
Going Low
CE# Setup to WE# Going Low
WE# Pulse Width
RP# V
V
Address Setup to WE# Going High
Data Setup to WE# Going High
Data Hold from WE# High
Address Hold from WE# High
CE# Hold from WE# High
WE# Pulse Width High
WE# High to RY/BY# Going Low
Write Recovery before Read
V
RY/BY# High
RP# V
RY/BY# High
PP
PP
VERSIONS
Setup to WE# Going High
Hold from Valid SRD,
HH
HH
Setup to WE# Going High
PARAMETER
Hold from Valid SRD,
HH
) until determination of block erase,
PPH1/2
IN
and D
A
(and if necessary RP#
= 0 to +70˚C or –25 to +85
IN
V
V
for block erase,
CC
CC
±0.25 V
±0.5 V
NOTE
2, 4
2, 4
2
2
2
3
3
LH28F008SCH-V85
LH28F008SC-V85/
(NOTE 5)
MIN.
100
100
85
10
40
40
40
10
30
- 31 -
1
5
5
0
0
0
5. See Fig. 9 "Transient Input/Output Reference
6. See Fig. 10 "Transient Input/Output Reference
MAX.
˚
C
90
(NOTE 1)
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (High Seed Configuration) for testing
characteristics.
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
LH28F008SCH-V85
(NOTE 6)
LH28F008SC-V85/
MIN.
100
100
90
10
40
40
40
10
30
1
5
5
0
0
0
MAX.
90
LH28F008SC-V/SCH-V
LH28F008SCH-V12
(NOTE 6)
LH28F008SC-V12/
MIN.
120
100
100
40
40
10
40
10
30
1
5
5
0
0
0
MAX.
90
UNIT
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns