LH28F008SCR-V12 Sharp Electronics, LH28F008SCR-V12 Datasheet - Page 26

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LH28F008SCR-V12

Manufacturer Part Number
LH28F008SCR-V12
Description
Manufacturer
Sharp Electronics
Datasheet

Specifications of LH28F008SCR-V12

Cell Type
NOR
Density
8Mb
Access Time (max)
120ns
Interface Type
Parallel
Boot Type
Not Required
Address Bus
20b
Operating Supply Voltage (typ)
5V
Operating Temp Range
0C to 70C
Package Type
TSOP-I
Sync/async
Asynchronous
Operating Temperature Classification
Commercial
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Word Size
8b
Number Of Words
1M
Supply Current
50mA
Mounting
Surface Mount
Pin Count
40
Lead Free Status / Rohs Status
Not Compliant
6.2.1 CAPACITANCE
NOTE :
1. Sampled, not 100% tested.
6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
C
C
SYMBOL
IN
OUT
AC test inputs are driven at 3.0 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output
timing ends, at 1.5 V. Input rise and fall times (10% to 90%) < 10 ns.
AC test inputs are driven at V
begins at V
90%) < 10 ns.
DEVICE
Fig. 11 Transient Equivalent Testing
UNDER
TEST
C
L
Capacitance
Includes Jig
Input Capacitance
Output Capacitance
0.45
3.0
0.0
2.4
IH
Fig. 9 Transient Input/Output Reference Waveform for V
Fig. 10 Transient Input/Output Reference Waveform for V
(2.0 V
PARAMETER
INPUT
Load Circuit
TTL
INPUT
(NOTE 1)
) and V
1.3 V
R
C
1N914
IL
L
OH
L
= 3.3 k
(0.8 V
(2.4 V
1.5
TTL
(High Speed Testing Configuration)
TTL
2.0
0.8
(Standard Testing Configuration)
). Output timing ends at V
T
OUT
) for a Logic "1" and V
A
= +25
TYP.
- 26 -
6
8
TEST POINTS
˚
C, f = 1 MHz
TEST POINTS
NOTE :
1. Applied to high-speed products, LH28F008SC-V85 and
V
V
CC
CC
Test Configuration Capacitance Loading Value
LH28F008SCH-V85.
MAX.
= 5.0±0.25 V
= 5.0±0.5 V
12
TEST CONFIGURATION
8
OL
IH
and V
(0.45 V
IL
. Input rise and fall times (10% to
TTL
UNIT
CC
(NOTE 1)
pF
pF
) for a Logic "0". Input timing
CC
1.5
= 5.0±0.25 V
= 5.0±0.5 V
0.8
2.0
OUTPUT
LH28F008SC-V/SCH-V
OUTPUT
V
V
IN
OUT
= 0.0 V
= 0.0 V
CONDITION
C
L
100
30
(pF)

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