LH28F008SAHT-T9 Sharp Electronics, LH28F008SAHT-T9 Datasheet - Page 23

• Manufacturer Part Number: LH28F008SAHT-T9
• Manufacturer: Sharp Electronics

Specifications of LH28F008SAHT-T9

• Cell Type: NOR
• Density: 8Mb
• Access Time (max): 90ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 20b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: -40C to 85C
• Package Type: TSOP
• Program/erase Volt (typ): 11.4 to 12.6V
• Sync/async: Asynchronous
• Operating Temperature Classification: Industrial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 1M
• Supply Current: 50mA
• Mounting: Surface Mount
• Pin Count: 40
• Lead Free Status / Rohs Status: Compliant

AC INPUT/OUTPUT REFERENCE WAVEFORM (1)
HIGH SPEED
AC INPUT/OUTPUT REFERENCE WAVEFORM (2)
NOTES:
1. Testing characteristics for LH28F008SA-85 in Standard configuration.
2. Testing characteristics for LH28F008SA-85 in High Speed configuration.
14. AC CHARACTERISTICS — Read-Only Operations
NOTES:
1. See AC Input/Output Reference Waveform for timing measurements.
2. OE# may be delayed up to t
3. Sampled, not 100% tested.
4. See High Speed AC Input/Output Reference Waveforms and High Speed AC Testing Load circuits for testing characteristics.
5. See AC Input/Output Reference Waveforms and AC Testing Load Circuits for testing characteristics.
AC test inputs are driven at V
(0.45V
(0.8V
to 90%) <10ns.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0".
Input timing begins, and output timing ends, at 1.5V. Input rise and fall
times (10% to 90%) <10ns.
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
Symbol
TTL
TTL
). Output timing ends at V
t
t
t
t
t
t
t
t
t
t
) for a Logic "0". Input timing begins at V
RC
ACC
CE
PWH
OE
LZ
HZ
OLZ
DF
OH
3.0
0.0
0.45
2.4
INPUT
INPUT
Read Cycle Time
Address to Output Delay
CE# to Output Delay
RP# High to Output Delay
OE# to Output Delay
CE# to Output Low Z
CE# High to Output High Z
OE# to Output Low Z
OE# High to Output High Z
Output Hold from
Addresses, CE# or OE#
Change,Whichever is First
1.5
Versions
2.0
0.8
Parameter
CE
TEST POINTS
TEST POINTS
OH
-t
IH
OE
and V
(2.4V
after the falling edge of CE# without impact on t
IL
TTL
. Input rise and fall times (10%
) for a Logic "1" and V
1.5
2.0
0.8
Notes
IH
2
2
3
3
3
3
3
(2.0V
OUTPUT
OUTPUT
LHF08ST9
TT
L ) and V
V
Min.
CC
85
0
0
0
=5V±0.25V
OL
(1)
IL
Max.
AC TESTING LOAD CIRCUIT (1)
HIGH SPEED
AC TESTING LOAD CIRCUIT (2)
400
85
85
40
55
30
(4)
CE
.
R
C
(C
V
R
C
(C
Min.
L
L
CC
90
L
L
L
0
0
0
=3.3kΩ
=100pF
L
=3.3kΩ
=30pF
Includes Jig Capacitance)
=5V±0.5V
Includes Jig Capacitance)
DEVICE
UNDER
TEST
DEVICE
UNDER
TEST
Max.
400
(5)
90
90
45
55
30
1.3V
1.3V
R
1N914
C
L
R
L
1N914
C
L
L
OUT
OUT
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
20