RC28F128J3D75D Numonyx - A DIVISION OF MICRON SEMICONDUCTOR PRODUCTS, INC., RC28F128J3D75D Datasheet - Page 21

• Manufacturer Part Number: RC28F128J3D75D
• Description: IC FLASH 128MBIT 75NS 64EZBGA
• Manufacturer: Numonyx - A DIVISION OF MICRON SEMICONDUCTOR PRODUCTS, INC.
• Series: -r

Specifications of RC28F128J3D75D

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 128M (16Mx8, 8Mx16)
• Speed: 75ns
• Interface: Parallel
• Voltage - Supply: 2.7 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-EZBGA
• Lead Free Status / Rohs Status: Contains lead / RoHS non-compliant
• Other names: 872828; 872828TR; 872828TR; RC28F128J3D75 S L8QN; RC28F128J3D75D; RC28F128J3D75DTR

Numonyx™ Embedded Flash Memory (J3 v D, Monolithic)
Table 7:
6.2
Table 8:
December 2007
316577-06
Notes:
1.
2.
3.
4.
5.
Symbol
Symbol
I
I
V
I
CCWS
CCES
V
CCE
PENLK
V
V
V
OH
OL
IH
IL
All currents are in RMS unless otherwise noted. These currents are valid for all product versions (packages and
speeds). Contact Numonyx or your local sales office for information about typical specifications.
Includes STS.
CMOS inputs are either V
Sampled, not 100% tested.
I
mode, the device’s current draw is I
CCWS
V
Clear Block Lock-Bits
Current
V
Suspend or Block
Erase Suspend
Current
CC
CC
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
V
Erase and Lock-Bit Operations
PEN
DC Current Characteristics (Sheet 2 of 2)
DC Voltage Characteristics (Sheet 1 of 2)
Block Erase or
and I
Program
DC Voltage specifications
Lockout during Program,
CCES
V
V
CCQ
CC
V
Parameter
V
CCQ
CC
Parameter
are specified with the device selected. If the device is read or written while in erase suspend
CC
± 0.2 V or GND ± 0.2 V. TTL inputs are either V
CCR
and I
0.85 × V
V
CCQ
CCWS
Typ
–0.5
35
40
Min
2.0
–
2.7 - 3.6V
2.7 - 3.6V
.
0.2
CCQ
Max
70
80
10
2.7 - 3.6 V
2.7 - 3.6 V
Unit
mA
mA
mA
V
CCQ
Max
0.8
0.4
0.2
2.2
+ 0.5V
CMOS Inputs, V
TTL Inputs, V
Device is enabled (see
Enable Truth Table for 32-, 64-,
128- and 256-Mb” on page 31
IL
or V
Unit
Test Conditions
PEN
V
V
V
V
V
V
V
IH
PEN
.
= V
= V
V
V
I
V
V
I
V
V
I
V
V
I
CC
OL
OL
OH
OH
CC
CCQ
CC
CCQ
CC
CCQ
CC
CCQ
Test Conditions
Table 16, “Chip
CC
= 2 mA
= 100 µA
= –2.5 mA
= –100 µA
= V
= V
= V
= V
= V
= V
= V
= V
CC
CC
CCMIN
CCMIN
CCQ
CCQ
CCQ
CCQ
Min
Min
Min
Min
Min
Min
)
Datasheet
2, 5, 6
2, 5, 6
Notes
Notes
1, 2
1, 2
2, 3
1,4
1,5
21