16089B Agilent Technologies Test Equipment, 16089B Datasheet - Page 14
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16089B
Manufacturer Part Number
16089B
Description
Kelvin Clip Leads for LCR meter 4263B
Manufacturer
Agilent Technologies Test Equipment
Datasheet
1.16089B.pdf
(16 pages)
14
Simplify and Improve Your Measurements
with Agilent's Test Accessories
Selecting a test fixture is as important as selecting the right
instrument. Agilent offers a wide range of accessories
for axial, radial, and SMD/Chip devices. In addition, a
variety of test leads are available to simplify remote testing
and systems applications. External test fixtures with
safety covers are also available.
Note: Refer to the accessory descriptions for frequency and operational limits.
1. Compatible when used in conjunction with 16085B.
2. 7-mm cable is required
3. Do not connect the ground lead to the instrument
4. 3.5-mm (M) to 7-mm adapter is required
Table 3. Test accessories/fixtures
16034E
16034G
16034H
1643A/B
16044A
16047A
16047D
16047E
16048A
16048B
16048D
16048E
16048G
16048H
16060A
16065A
16065C
16085B
16089A/B/C/D/E Kelvin clip leads
16092A
16094A
16095A
16191A
16192A
16194A
16196A/B/C/D
16197A
16200B
16314A
16315A
16316A
16317A
16334A
16451B
16452A
16453A
16454A
42842A/B
42842C
42941A
42942A
SMD/chip test fixture
SMD/chip test fixture, small
SMD/chip test fixture, general
3-terminal SMD test fixture
SMD/chip test fixture, Kelvin contacts, 10 MHz
Axial and radial test fixture
Axial and radial test fixture
Axial and radial test fixture, 110MHz
One meter test leads, BNC
One meter test leads, SMC
Two meter test leads, BNC
Four meter test leads, BNC
One meter test leads, BNC, 110 MHz
Two meter test leads, BNC, 110 MHz
Transformer test fixture
Ext. voltage bias with safety cover (<=200 vdc)
External bias adapter (<=40 vdc)
Four-terminal pair to 7-mm adapter
RF spring clip: axial, radial and SMD
RF probe tip/adapter
LF impedance probe
Side (bottom) electrode SMD test fixture
Parallel electrode SMD test fixture
High temperature component test fixture
Parallel electrode SMD test fixture
Bottom electrode SMD test fixture
External DC bias adapter
4-terminal balun (50 Ohm bal. to 50 Ohm unbal.)
One terminal (BNC) Balun (50 Ohm bal. to 50 Ohm unbal.)
One terminal (BNC) Balun (100 Ohm bal. to 50 Ohm unbal.) 100 Hz-10 MHz
One terminal (BNC) Balun (600 Ohm bal. to 50 Ohm unbal.) 100 Hz-3 MHz
SMD/chip tweezer
Dielectric material test fixture
Liquid test fixture
Dielectric material test fixture
Dielectric material test fixture
High bias current 20 A/40T test fixture
High bias current 10 A test fixture
Impedance probe kit
Four-terminal pair to 7-mm adapter
DC-40 MHz
DC-110 MHz
DC-110 MHz
DC-110 MHz
DC-10 MHz
DC-13 MHz
DC-40 MHz
DC-110 MHz
DC-30 MHz
DC-30 MHz
DC-30 MHz
DC-1 MHz
DC-110 MHz
DC-110 MHz
DC-100 kHz
50 Hz-2 MHz
50 Hz-1 MHz
DC-40 MHz
5 Hz-100 kHz
DC-500 MHz
DC-125 MHz
DC-13 MHz
DC-2 GHz
DC-2 GHz
DC-2 GHz
DC-3 GHz
DC-3 GHz
1 MHz-1 GHz
100 Hz-10 MHz
100 Hz-10 MHz
DC-15 MHz
5 Hz-30 MHz
20 Hz-30 MHz
1 MHz-1 GHz
1 kHz-1 GHz
20 Hz-1 MHz
75 kHz-30 MHz
DC-110 MHz
DC-110 MHz
You will improve your measurement results with the
proper test fixture.
• more reliable and repeatable measurement
• higher through-put
• fewer handling errors
• tighter test limits
• better measurement accuracy
For sales information or technical assistance call
Agilent Technologies.
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