16089B Agilent Technologies Test Equipment, 16089B Datasheet - Page 13
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16089B
Manufacturer Part Number
16089B
Description
Kelvin Clip Leads for LCR meter 4263B
Manufacturer
Agilent Technologies Test Equipment
Datasheet
1.16089B.pdf
(16 pages)
RF SMD/chip components
16191A bottom-electrode SMD test
fixture
Maximum dc bias: ±40 V
16200B external DC bias adapter
External dc bias: up to 5 A, ±40 V
Test Fixtures and Accessories (7-mm Terminal)
16196A/B/C/D SMD test fixture
electrode SMDs.
Frequency: dc to 3 GHz
Maximum dc bias: ±40 V
Applicable SMD size:
Frequency: dc to 2 GHz
Frequency: 1 MHz to 1 GHz
Coaxial fixture for parallel
16196A: 1.6 mm x 0.8 mm
16196B: 1.0 mm x 0.5 mm
16196C: 0.6 mm x 0.3 mm
16196D: 0.4mm x 0.2mm
16197A bottom-electrode SMD
test fixture
Maximum dc bias: ±40 V
16192A parallel-electrode SMD
test fixture
Maximum dc bias: ±40 V
Material measurements
16453A dielectric test fixture
Sample size (smooth sheets only):
Frequency: dc to 3 GHz
Frequency: 1 MHz to 1 GHz
Frequency: dc to 2 GHz
thickness: 0.3 mm to 3 mm
diameter: ≥ 15 mm
16092A axial, radial, and
SMD test fixture
Frequency: ≤ 500 MHz
Maximum dc bias: ±40 V
16194A high temperature component
test fixture
Maximum dc bias: ±40 V
Operating temperature: -55 °C to
16454A magnetic test fixtures
Sample size (toroids only):
Frequency: dc to 2 GHz
Frequency: 1 kHz to 1 GHz
height: ≤ 8.5 mm
inner diameter: ≥ 3.1 mm
outer diameter: ≤ 20 mm
+200 °C
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