AD9952YSVZ Analog Devices Inc, AD9952YSVZ Datasheet - Page 6

• Manufacturer Part Number: AD9952YSVZ
• Description: IC DDS 14BIT DAC 1.8V 48-TQFP
• Manufacturer: Analog Devices Inc

Specifications of AD9952YSVZ

• Resolution (bits): 14 b
• Master Fclk: 400MHz
• Tuning Word Width (bits): 32 b
• Voltage - Supply: 1.71 V ~ 1.96 V
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 48-TQFP Exposed Pad, 48-eTQFP, 48-HTQFP, 48-VQFP
• Pll Type: Frequency Synthesis
• Frequency: 400MHz
• Supply Voltage Range: 1.71V To 1.89V
• Digital Ic Case Style: TQFP
• No. Of Pins: 48
• Operating Temperature Range: -40°C To +105°C
• Msl: MSL 3 - 168 Hours
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: AD9952/PCB - BOARD EVAL FOR AD9952
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

AD9952
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Maximum Junction Temperature
DVDD_I/O
AVDD, DVDD
Digital Input Voltage (DVDD_I/O = 3.3 V)
Digital Input Voltage (DVDD_I/O = 1.8 V)
Digital Output Current
Storage Temperature Range
Operating Temperature Range
Lead Temperature (10 sec Soldering)
θ
θ
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
JA
JC
Rating
150°C
4 V
2 V
–0.7 V to +5.25 V
–0.7 V to +2.2 V
5 mA
–65°C to +150°C
–40°C to +105°C
300°C
38°C/W
15°C/W
Rev. B | Page 6 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.