EP1S60F1508C7N Altera, EP1S60F1508C7N Datasheet - Page 118

• Manufacturer Part Number: EP1S60F1508C7N
• Description: IC STRATIX FPGA 60K LE 1508-FBGA
• Manufacturer: Altera
• Series: Stratix®r

Specifications of EP1S60F1508C7N

• Number Of Logic Elements/cells: 57120
• Number Of Labs/clbs: 5712
• Total Ram Bits: 5215104
• Number Of I /o: 1022
• Voltage - Supply: 1.425 V ~ 1.575 V
• Mounting Type: Surface Mount
• Operating Temperature: 0°C ~ 85°C
• Package / Case: 1508-FBGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Number Of Gates: -

I/O Structure
I/O Structure
2–104
Stratix Device Handbook, Volume 1
Control Signals
The fast PLL has the same lock output, pllenable input, and areset
input control signals as the enhanced PLL.
If the input clock stops and causes the PLL to lose lock, then the PLL must
be reset for correct phase shift operation.
For more information on high-speed differential I/O support, see
Speed Differential I/O Support” on page
IOEs provide many features, including:
■
■
■
■
■
■
■
■
■
■
■
■
■
■
■
The IOE in Stratix devices contains a bidirectional I/O buffer, six
registers, and a latch for a complete embedded bidirectional single data
rate or DDR transfer.
IOE contains two input registers (plus a latch), two output registers, and
two output enable registers. The design can use both input registers and
the latch to capture DDR input and both output registers to drive DDR
outputs. Additionally, the design can use the output enable (OE) register
for fast clock-to-output enable timing. The negative edge-clocked OE
register is used for DDR SDRAM interfacing. The Quartus II software
automatically duplicates a single OE register that controls multiple
output or bidirectional pins.
Dedicated differential and single-ended I/O buffers
3.3-V, 64-bit, 66-MHz PCI compliance
3.3-V, 64-bit, 133-MHz PCI-X 1.0 compliance
Joint Test Action Group (JTAG) boundary-scan test (BST) support
Differential on-chip termination for LVDS I/O standard
Programmable pull-up during configuration
Output drive strength control
Slew-rate control
Tri-state buffers
Bus-hold circuitry
Programmable pull-up resistors
Programmable input and output delays
Open-drain outputs
DQ and DQS I/O pins
Double-data rate (DDR) Registers
Figure 2–59
shows the Stratix IOE structure. The
2–130.
Altera Corporation
July 2005
“High-