EPF10K100ABI600-2 Altera, EPF10K100ABI600-2 Datasheet - Page 44

• Manufacturer Part Number: EPF10K100ABI600-2
• Description: IC FLEX 10KA FPGA 100K 600-BGA
• Manufacturer: Altera
• Series: FLEX-10K®r

Specifications of EPF10K100ABI600-2

• Number Of Logic Elements/cells: 4992
• Number Of Labs/clbs: 624
• Total Ram Bits: 24576
• Number Of I /o: 406
• Number Of Gates: 158000
• Voltage - Supply: 3 V ~ 3.6 V
• Mounting Type: Surface Mount
• Operating Temperature: -40°C ~ 100°C
• Package / Case: 600-BGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Generic Testing
Operating
Conditions
44
FLEX 10K Embedded Programmable Logic Device Family Data Sheet
Symbol
V
V
I
T
T
T
Table 17. FLEX 10K 5.0-V Device Absolute Maximum Ratings
OUT
STG
AMB
J
CC
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
Each FLEX 10K device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100% yield.
AC test measurements for FLEX 10K devices are made under conditions
equivalent to those shown in
to configure devices during all stages of the production flow.
Figure 19. FLEX 10K AC Test Conditions
Tables 17
recommended operating conditions, DC operating conditions, and
capacitance for 5.0-V FLEX 10K devices.
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients flow through the
parasitic inductance between the device
ground pin and the test system ground,
significant reductions in observable noise
immunity can result. Numbers without
parentheses are for 5.0-V devices or outputs.
Numbers in parentheses are for 3.3-V devices
or outputs. Numbers in brackets are for
2.5-V devices or outputs.
through
With respect to ground
No bias
Under bias
Ceramic packages, under bias
PQFP, TQFP, RQFP, and BGA
packages, under bias
21
provide information on absolute maximum ratings,
Conditions
Figure
(2)
Note (1)
19. Multiple test patterns can be used
Device
Output
Device input
rise and fall
times < 3 ns
(8.06 k )
(703 )
[481
[521 ]
464
250
–2.0
–2.0
Min
–25
–65
–65
Altera Corporation
C1 (includes
JIG capacitance)
Max
150
135
150
135
7.0
7.0
25
To Test
System
VCC
Unit
mA
° C
° C
° C
° C
V
V