MT41J512M8THD-15E:D Micron Technology Inc, MT41J512M8THD-15E:D Datasheet - Page 9

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MT41J512M8THD-15E:D

Manufacturer Part Number
MT41J512M8THD-15E:D
Description
IC DDR3 SDRAM 4GBIT 78FBGA
Manufacturer
Micron Technology Inc
Type
DDR3 SDRAMr
Series
-r
Datasheet

Specifications of MT41J512M8THD-15E:D

Organization
512Mx8
Address Bus
18b
Maximum Clock Rate
1.333GHz
Operating Supply Voltage (typ)
1.5V
Package Type
FBGA
Operating Temp Range
0C to 95C
Operating Supply Voltage (max)
1.575V
Operating Supply Voltage (min)
1.425V
Pin Count
78
Mounting
Surface Mount
Operating Temperature Classification
Commercial
Format - Memory
RAM
Memory Type
DDR3 SDRAM
Memory Size
4G (512M x 8)
Speed
667MHz
Interface
Parallel
Voltage - Supply
1.425 V ~ 1.575 V
Operating Temperature
0°C ~ 95°C
Package / Case
78-TFBGA
Lead Free Status / Rohs Status
Compliant

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Electrical Specifications
Table 4:
Temperature and Thermal Impedance
PDF: 09005aef83188bab/Source: 09005aef83169de6
MT41J1G4_64M_32M_twindie.fm - Rev. F 11/09 EN
V
Symbol
IN
V
I
V
T
VREF
, V
DDQ
T
STG
DD
I
I
C
OUT
Parameter
V
V
Voltage on any ball relative to V
Input leakage current
Any input 0V ≤ V
V
(All other pins not under test = 0V)
V
V
(All other pins not under test = 0V)
Operating case temperature
Storage temperature
Absolute Maximum Ratings
DD
DD
REF
REF
REFDQ
supply voltage relative to V
supply voltage relative to V
pin 0V ≤ V
supply leakage current
= V
Notes: 1. V
DD
/2 or V
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other conditions
outside those indicated in the device data sheet is not implied. Exposure to absolute
maximum rating conditions for extended periods may adversely affect reliability.
IN
It is imperative that the DDR3 SDRAM device’s temperature specifications, shown in
Table 5 on page 10, be maintained to ensure the junction temperature is in the proper
operating range to meet data sheet specifications. An important step in maintaining the
proper junction temperature is using the device’s thermal impedances correctly. Ther-
mal impedances listed in Table 6 on page 10 apply to the current die revision and pack-
ages.
Incorrectly using thermal impedances can produce significant errors. Read Micron tech-
nical note
Table 6. For designs that are expected to last several years and require the flexibility to
use several DRAM die shrinks, consider using final target theta values (rather than exist-
ing values) to account for increased thermal impedances from the reduction in die size.
The DDR3 SDRAM device’s safe junction temperature range can be maintained when
the T
ature is too high, use of forced air and/or heat sinks may be required to satisfy the case
temperature specifications.
2. The minimum limit requirement is for testing purposes. The leakage current on the V
3. MAX operating case temperature. T
4. Device functionality is not guaranteed if the DRAM device exceeds the maximum T
IN
≤ 1.1V
≤ V
greater than 0.6 × V
pin should be minimal.
Figure 5 on page 10).
ing operation.
REFCA
C
DD
DD
specification is not exceeded. In applications where the device’s ambient temper-
and V
,
= V
TN-00-08: “Thermal Applications,”
DD
DDQ
/2
SS
SSQ
SS
must be within 300mV of each other at all times, and V
DDQ
. When V
9
Min
–0.4
–0.4
–0.4
–55
–4
–2
0
DD
C
and V
is measured in the center of the package (see
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DDQ
4Gb: x4, x8 TwinDie DDR3 SDRAM
prior to using the thermal impedances in
1.975
1.975
1.975
Max
150
+4
+2
95
are less than 500mV, V
Electrical Specifications
Units
©2008 Micron Technology, Inc. All rights reserved.
µA
µA
°C
°C
V
V
V
REF
REF
may be ≤300mV.
must not be
Notes
3, 4
1
2
C
dur-
REF

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