AD5424YCPZ-REEL7 Analog Devices Inc, AD5424YCPZ-REEL7 Datasheet - Page 6

• Manufacturer Part Number: AD5424YCPZ-REEL7
• Description: IC DAC 8BIT MULTIPLYING 20-LFCSP
• Manufacturer: Analog Devices Inc

Specifications of AD5424YCPZ-REEL7

• Settling Time: 30ns
• Number Of Bits: 8
• Data Interface: Parallel
• Number Of Converters: 1
• Voltage Supply Source: Single Supply
• Power Dissipation (max): 25µW
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 20-LFCSP
• For Use With: EVAL-AD5424EBZ - BOARD EVALUATION FOR AD5424
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5424/AD5433/AD5445
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
I
Logic Inputs and Output
Operating Temperature Range
Storage Temperature Range
Junction Temperature
16-Lead TSSOP θ
20-Lead TSSOP θ
20-Lead LFCSP θ
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature (<20 sec)
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
OUT
DD
REF
A
Extended Industrial (Y Version)
= 25°C, unless otherwise noted.
1, I
, R
to GND
FB
OUT
to GND
2 to GND
JA
JA
JA
Thermal Impedance
Thermal Impedance
Thermal Impedance
1
Rating
–0.3 V to +7 V
–12 V to +12 V
–0.3 V to +7 V
–0.3 V to V
–40°C to +125°C
–65°C to +150°C
150°C
150°C/W
143°C/W
135°C/W
300°C
235°C
DD
+ 0.3 V
Rev. B | Page 6 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
1
Overvoltages at DBx, CS , and R/ W , are clamped by internal diodes.