2-66507-8 TE Connectivity, 2-66507-8 Datasheet - Page 6

• Manufacturer Part Number: 2-66507-8
• Description: HD 20 CONT,AU PLTD
• Manufacturer: TE Connectivity

Specifications of 2-66507-8

• Rohs Compliant: YES
• Product Type: Contact
• Product Series: HDP-20 (Crimp Snap)
• Termination Method To Wire/cable: Crimp
• Wire Insulation Diameter (mm [in]): 0.76 – 1.02 [0.030 – 0.040]
• Insulation Support: Yes
• Grade: Standard
• Contact Retention In Housing: Crimp Snap-In
• Solder Tail Contact Plating: Gold Flash over Nickel
• Pin Diameter (mm [in]): 1.02 [0.040]
• Wire Range (mm² [awg]): 0.08 - 0.20 [28-24]
• Used With: CPC Connectors, AMPLIMITE HDP-20
• Contact Type: Pin
• Contact Base Material: Brass
• Contact Plating, Mating Area, Material: Gold (50)
• Contact Size: 20
• Rohs/elv Compliance: RoHS compliant, ELV compliant
• Lead Free Solder Processes: Not relevant for lead free process
• Rohs/elv Compliance History: Always was RoHS compliant
• Packaging Method: Strip

4.
4.1.
4.2.
4.3.
4.4.
Rev F
QUALITY ASSURANCE PROVISIONS
Qualification Testing
A.
B.
Requalification Testing
If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determ ined by developm ent/product, quality and reliability engineering.
Acceptance
Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures
attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. If product
failure occurs, corrective action shall be taken and specim ens resubm itted for qualification. Testing to
confirm corrective action is required before resubm ittal.
Quality Conform ance Inspection
The applicable quality inspection plan shall specify the sam pling acceptable quality level to be used.
Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing
and this specification.
Specim en Selection
Connector housings and contacts shall be prepared in accordance with applicable Instruction
Sheets and selected at random from current production. Test groups shall consist of the following:
1.
2.
3.
4.
Test Sequence
Qualification inspection shall be verified by testing specim ens as specified in Figure 2.
Test Groups 1 and 3 shall consist of 10, size 1 (9 position) crim p-snap connector m ated pairs
(plugs without grounding indents), fully loaded with crim p-snap contacts with insulation
support and crim ped to 24 AW G wire. Group 1 uses gold flash and 30 gold contacts. Group 3
uses only gold flash contacts. Cable clam ps are to be used on all connectors. During vibration
and physical shock tests, screwlocks and m ale screws are to be used to secure the
connectors.
Test Group 2 shall consist of 15 m ated pairs, size 5 (50 position) crim p-snap connectors. Five
m ated pairs are loaded with 18 AW G wires, 5 with 24 AW G wire and 5 with 28 AW G wire.
The plugs have no grounding indents, and the wires are crim ped to contacts without
insulation support. The contacts are gold flash plated. Cable clam ps are to be used on all
connectors.
Test Group 4 shall consist of 30 each of contacts with insulation support crim ped to 24, 26,
and 28 AW G wire. The 18, 20 and 22 AW G wires are crim ped to contacts without insulation
support. The contacts are gold flash plated.
Test Group 5 shall consist of 5 of each size of m ated pairs fully loaded with contacts. The
plugs have grounding indents. The contacts are gold flash plated.
108-40005
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