2-66507-8 TE Connectivity, 2-66507-8 Datasheet - Page 3

HD 20 CONT,AU PLTD

2-66507-8

Manufacturer Part Number
2-66507-8
Description
HD 20 CONT,AU PLTD
Manufacturer
TE Connectivity
Datasheets

Specifications of 2-66507-8

Rohs Compliant
YES
Product Type
Contact
Product Series
HDP-20 (Crimp Snap)
Termination Method To Wire/cable
Crimp
Wire Insulation Diameter (mm [in])
0.76 – 1.02 [0.030 – 0.040]
Insulation Support
Yes
Grade
Standard
Contact Retention In Housing
Crimp Snap-In
Solder Tail Contact Plating
Gold Flash over Nickel
Pin Diameter (mm [in])
1.02 [0.040]
Wire Range (mm² [awg])
0.08 - 0.20 [28-24]
Used With
CPC Connectors, AMPLIMITE HDP-20
Contact Type
Pin
Contact Base Material
Brass
Contact Plating, Mating Area, Material
Gold (50)
Contact Size
20
Rohs/elv Compliance
RoHS compliant, ELV compliant
Lead Free Solder Processes
Not relevant for lead free process
Rohs/elv Compliance History
Always was RoHS compliant
Packaging Method
Strip
Tem perature rise vs current.
Vibration, random .
Mechanical shock.
Durability.
Mating force.
Unm ating force.
Contact insertion force.
Rev F
Test Description
30°C m axim um tem perature rise at
specified current.
No discontinuities of 1 m icrosecond
or longer duration.
See Note.
No discontinuities of 1 m icrosecond
or longer duration.
See Note.
See Note.
Size Posn
Size Posn
13.3 N [3 lbf] m axim um per contact. EIA-364-5.
1
2
3
4
5
1
2
3
4
5
15
25
37
50
15
25
37
50
9
9
Figure 1 (continued)
MECHANICAL
Requirem ent
12.5 [2.8]
20.9 [4.7]
34.7 [7.8]
51.6 [11.6] 177.9 [40]
69.4 [15.6] 195.7 [44]
12.5 [2.8]
20.9 [4.7]
34.7 [7.8]
51.6 [11.6] 177.9 [40]
69.4 [15.6] 195.7 [44]
(N [lbf] m axim um )
W ithout
(N [lbf] m axim um )
W ithout
Ground Indents
Ground Indents
133.4 [30]
146.8 [33]
164.6 [37]
133.4 [30]
146.8 [33]
164.6 [37]
W ith
W ith
EIA-364-70, Method 1.
Stabilize at a single current level
until 3 readings at 5 m inute intervals
are within 1°C.
See Figure 4.
EIA-364-28, Test Condition V,
Condition F.
Subject m ated specim ens to 20.71
G's rm s between 50 to 2000 Hz.
Fifteen m inutes in each of 3
m utually perpendicular planes.
See Figure 5.
EIA-364-27, Method A.
Subject m ated specim ens to 50 G's
half-sine shock pulses of 11
m illiseconds duration. Three shocks
in each direction applied along 3
m utually perpendicular planes, 18
total shocks.
See Figure 5.
EIA-364-9.
Mate and unm ate gold flash
specim ens for 100 cycles, and 30
ìin gold specim ens for 500 cycles
at a m axim um rate of 200 cycles
per hour.
EIA-364-13.
Measure force necessary to m ate
specim ens at a m axim um rate of
25.4 m m [1 in] per m inute.
EIA-364-13.
Measure force necessary to unm ate
specim ens at a m axim um rate of
25.4 m m [1 in] per m inute.
Measure force necessary to insert
contact into housing.
Procedure
108-40005
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