ISL12008IB8Z Intersil, ISL12008IB8Z Datasheet - Page 4

• Manufacturer Part Number: ISL12008IB8Z
• Description: IC RTC I2C LO-POWER 8-SOIC
• Manufacturer: Intersil
• Type: Clock/Calendarr

Specifications of ISL12008IB8Z

• Time Format: HH:MM:SS (24 hr)
• Date Format: YY-MM-DD-dd
• Interface: I²C, 2-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Memory Size: -

Serial Interface Specifications
NOTES:
2. FT/OUT inactive.
3. LPMODE = 0 (default).
4. In order to ensure proper timekeeping, the V
5. Typical values are for T = +25°C and 3.3V supply voltage.
6. Limits should be considered typical and are not production tested.
7. These are I
8. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
SYMBOL
t
t
t
t
t
t
HD:STO
HD:STA
SU:DAT
HD:DAT
SU:STO
SU:STA
t
t
t
f
HIGH
LOW
Rpu
characterization and are not production tested.
SCL
t
BUF
t
t
Cb
DH
AA
t
t
IN
R
F
SCL Frequency
Pulse width Suppression Time at SDA and
SCL Inputs
SCL Falling Edge to SDA Output Data Valid
Time the Bus Must be Free Before the Start
of a New Transmission
Clock LOW Time
Clock HIGH Time
START Condition Setup Time
START Condition Hold Time
Input Data Setup Time
Input Data Hold Time
STOP Condition Setup Time
STOP Condition Hold Time
Output Data Hold Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Capacitive Loading of SDA or SCL
SDA and SCL Bus Pull-Up Resistor Off-Chip Maximum is determined by t
2
C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate specification.
PARAMETER
4
Recommended Operating Conditions. Unless otherwise specified. (Continued)
DD SR-
specification must be followed.
Any pulse narrower than the max
spec is suppressed.
SCL falling edge crossing 30% of
V
70% of V
SDA crossing 70% of V
a STOP condition, to SDA
crossing 70% of V
following START condition.
Measured at the 30% of V
crossing.
Measured at the 70% of V
crossing.
SCL rising edge to SDA falling
edge. Both crossing 70% of V
From SDA falling edge crossing
30% of V
crossing 70% of V
From SDA exiting the 30% to 70%
of V
crossing 30% of V
From SCL falling edge crossing
30% of V
30% to 70% of V
From SCL rising edge crossing
70% of V
crossing 30% of V
From SDA rising edge to SCL
falling edge. Both crossing 70% of
V
From SCL falling edge crossing
30% of V
30% to 70% of V
From 30% to 70% of V
From 70% to 30% of V
Total on-chip and off-chip
and t
For Cb = 400pF, max is about
2kΩ to~2.5kΩ.
For Cb = 40pF, max is about 15kΩ
to ~20kΩ.
DD
DD
DD
, until SDA exits the 30% to
.
F
.
TEST CONDITIONS
ISL12008
window, to SCL rising edge
DD
DD
DD
DD
DD
, to SDA rising edge
, until SDA enters the
window.
to SCL falling edge
to SDA entering the
DD
DD
DD
DD
DD.
DD
window.
window.
.
.
during the
DD
DD
DD
DD
DD
during
R
DD
.
(Note 8)
0.1 x Cb
0.1 x Cb
1300
1300
20 +
20 +
MIN
600
600
600
100
600
600
20
10
0
1
(Note 5)
TYP
(Note 8)
MAX
400
900
900
300
300
400
50
UNITS NOTES
September 26, 2008
kHz
kΩ
ns
pF
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
FN6690.1
6, 7
6, 7
6, 7
6, 7