PCK2001MDB,118 NXP Semiconductors, PCK2001MDB,118 Datasheet - Page 7
![IC 1:10 CLOCK BUFFER 28SSOP](/photos/6/52/65218/568-28-ssop_sot341-1_sml.jpg)
PCK2001MDB,118
Manufacturer Part Number
PCK2001MDB,118
Description
IC 1:10 CLOCK BUFFER 28SSOP
Manufacturer
NXP Semiconductors
Type
Fanout Buffer (Distribution)r
Datasheet
1.PCK2001MDB118.pdf
(14 pages)
Specifications of PCK2001MDB,118
Package / Case
28-SSOP
Number Of Circuits
1
Ratio - Input:output
1:10
Differential - Input:output
No/No
Input
LVTTL
Output
LVTTL
Frequency - Max
150MHz
Voltage - Supply
3.135 V ~ 3.465 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Frequency-max
150MHz
Max Input Freq
14.318 MHz
Propagation Delay (max)
2.5 ns
Supply Voltage (max)
3.5 V
Supply Voltage (min)
3.1 V
Maximum Power Dissipation
850 mW
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Max Output Freq
150 MHz
Mounting Style
SMD/SMT
Supply Current
50 uA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
935262449118
PCK2001MDB-T
PCK2001MDB-T
PCK2001MDB-T
PCK2001MDB-T
1. Clock period and skew are measured on the rising edge at 1.5 V.
2. T
3. T
4. T
5. Duty cycle should be tested with a 50/50% input.
6. Over MIN (20 pF) to MAX (30 pF) discrete load, process, voltage, and temperature.
7. Input edge rate for these tests must be faster than 1 V/ns.
8. Calculated at minimum edge rate (1.5 ns) to guarantee 45/55% duty cycle at 1.5 V. Pulsewidth is required to be wider at the faster edge to
9. All typical values are at V
10. Typical is measured with MAX (30 pf) discrete load.
11. Typical is measured with MIN (20 pf) discrete load.
Philips Semiconductors
AC CHARACTERISTICS
NOTES:
2000 May 17
DUTY CYCLE
14.318–150 MHz I
T
T
ensure duty cycle specification is met.
SYMBOL
T
T
PZL
PLZ
T
T
SDKH
SDKL
SDRISE
T
T
T
T
T
T
T
T
T
SDRISE
SDFALL
SDSKW
DDSKW
T
T
SDKH
SDKH
SDKH
SDKP
SDKL
SDKP
SDKL
SDKP
SDKL
PLH
PHL
, T
, T
is measured at 0.4 V as shown in Figure 3.
PZH
PHZ
is measured at 2.4 V as shown in Figure 3.
and T
SDFALL
SDRAM buffer LH propagation delay
SDRAM buffer HL propagation delay
SDRAM buffer disable time
SDRAM buffer enable time
SDRAM CLK HIGH time
SDRAM CLK HIGH time
SDRAM CLK HIGH time
are measured as a transition through the threshold region V
SDRAM CLK LOW time
SDRAM CLK LOW time
SDRAM CLK LOW time
SDRAM Bus CLK skew
Device to device skew
SDRAM CLK period
SDRAM CLK period
SDRAM CLK period
CC
Output Duty Cycle
SDRAM rise time
SDRAM fall time
PARAMETER
= 3.3 V and T
2
C 1:10 clock buffer
amb
= 25 C.
Measured at 1.5 V
TEST CONDITIONS
100 MHz
133 MHz
66 MHz
7
NOTES
4, 6, 10
4, 6, 11
2, 6, 8
3, 6, 8
2, 6, 8
3, 6, 8
2, 6, 8
3, 6, 8
5, 6, 7
1, 6
1, 6
1, 6
1, 6
6, 7
6, 7
6, 7
6, 7
OL
= 0.4 V and V
MIN
15.0
10.0
5.6
5.3
3.3
3.1
7.4
2.6
2.1
1.5
1.5
1.0
1.0
1.0
1.0
45
T
amb
OH
= 2.4 V (1 mA) JEDEC specification.
= 0 C to +70 C
LIMITS
TYP
10.01
15.2
150
7.8
7.4
5.1
4.9
7.5
3.2
2.8
2.0
2.9
2.5
2.5
2.6
2.7
52
9
PCK2001M
MAX
15.5
10.5
250
250
Product specification
8.4
8.0
5.7
5.5
7.7
3.8
3.5
4.0
4.0
3.5
3.5
5.0
5.0
55
UNIT
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
ps
ps
%