LCMXO2-1200ZE-1TG100IR1 Lattice, LCMXO2-1200ZE-1TG100IR1 Datasheet - Page 77
LCMXO2-1200ZE-1TG100IR1
Manufacturer Part Number
LCMXO2-1200ZE-1TG100IR1
Description
IC PLD 1280LUTS 80I/O 100TQFP
Manufacturer
Lattice
Datasheet
1.LCMXO2-1200HC-4TG100CR1.pdf
(103 pages)
Specifications of LCMXO2-1200ZE-1TG100IR1
Programmable Type
*
Number Of Macrocells
*
Voltage - Input
*
Speed
*
Mounting Type
*
Package / Case
*
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
220-1144
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LCMXO2-1200ZE-1TG100IR1
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
- Current page: 77 of 103
- Download datasheet (2Mb)
Lattice Semiconductor
Switching Test Conditions
Figure 3-13 shows the output test load used for AC testing. The specific values for resistance, capacitance, volt-
age, and other test conditions are shown in Table 3-5.
Figure 3-13. Output Test Load, LVTTL and LVCMOS Standards
Table 3-5. Test Fixture Required Components, Non-Terminated Interfaces
Note: Output test conditions for all other interfaces are determined by the respective standards.
LVTTL and LVCMOS settings (L -> H, H -> L)
LVTTL and LVCMOS 3.3 (Z -> H)
LVTTL and LVCMOS 3.3 (Z -> L)
Other LVCMOS (Z -> H)
Other LVCMOS (Z -> L)
LVTTL + LVCMOS (H -> Z)
LVTTL + LVCMOS (L -> Z)
Test Condition
DUT
188
R1
V
R1
T
3-38
0pF
0pF
CL
CL
LVTTL, LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
1.5
1.5
V
V
V
V
Test Poi n t
OH
OL
CCIO
CCIO
DC and Switching Characteristics
- 0.15
- 0.15
/2
/2
MachXO2 Family Data Sheet
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
V
V
V
V
VT
—
—
—
—
—
OH
OH
OH
OL
OL
OL
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