5962-89689012A QP SEMICONDUCTOR, 5962-89689012A Datasheet - Page 9

• Manufacturer Part Number: 5962-89689012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-89689012A

• Logical Function: Mux
• Configuration: 4 x 2:1
• Number Of Inputs: 8
• Number Of Outputs: 4
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Power Dissipation: 500mW
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Package Type: CLLCC
• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
5/
9/
11/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic
4/
6/
7/
8/
10/ Power dissipation capacitance (C
12/ AC limits at V
This test may be performed either one input at a time (preferred method) or with all input pins simultaneously at
V
the alternate test method, the maximum limit is equal to the number of inputs at a high TTL input level times 1.6 mA; and
the preferred method and limits are guaranteed.
The word "All" in the device type and device class column, means limits for all device types and classes.
The V
V
V
The V
Three-state output conditions are required.
(I
and I
input signal.
patterns used for fault detection. The test vectors used to verify the truth table shall, at a minimum, test all functions of
each input and output. All possible input to output logic patterns per function shall be guaranteed, if not tested, to the
truth table in figure 2 herein. Functional tests shall be performed in sequence as approved by the qualifying activity on
qualified devices. H  2.5 V, L < 2.5 V; high inputs = 2.4 V and low inputs = 0.4 V. The input voltage levels have the
allowable tolerances in accordance with MIL-STD-883 already incorporated.
limits for V
propagation delay tests, all paths must be tested.
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND
and the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the
minimum and maximum limits, as applicable, listed herein. All devices shall meet or exceed the limits specified in table I,
as applicable, at 4.5 V  V
IN
CC
CC
CC
DEFENSE SUPPLY CENTER COLUMBUS
= V
x V
= 5.5 V. Limits shown apply to operation at V
= 5.5 V with a 2 ms duration maximum.
S
OH
IH
, n is the number of device inputs at TTL levels, f is the frequency of the input signal, and d is the duty cycle of the
MICROCIRCUIT DRAWING
CC
CC
COLUMBUS, OHIO 43218-3990
and V
and V
) + (n x d x I
- 2.1 V (alternate method). Classes Q and V shall use the preferred method. When the test is performed using
CC
= 5.5 V are 1.0 ns and guaranteed by guardbanding the V
CC
IL
OL
tests are not required if applied as forcing functions for V
STANDARD
= 5.5 V are equal to the limits at V
tests shall be tested at V
CC
x V
CC
TABLE I. Electrical performance characteristics - Continued.
CC
 5.5 V.
). The dynamic current consumption, I
PD
) determines the no load dynamic power consumption, PD = (C
CC
= 4.5 V. The V
CC
CC
= 5.0 V 0.5 V. Transmission driving tests are performed at
= 4.5 V and guaranteed by testing at V
OH
and V
SIZE
A
OL
S
CC
= (C
tests are guaranteed, if not tested, for
OH
= 4.5 V minimum limits to 1.5 ns. For
and V
PD
REVISION LEVEL
+ C
OL
L
) V
tests.
CC
D
f + I
CC
CC
+ n x d x I
= 4.5 V. Minimum ac
PD
+ C
SHEET
5962-89689
L
CC
) (V
. For both P
CC
9
x V
CC
)f +
D