5962-8959820MZA QP SEMICONDUCTOR, 5962-8959820MZA Datasheet - Page 41

• Manufacturer Part Number: 5962-8959820MZA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8959820MZA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical
parameters to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option,
either perform delta measurements or within 24 hours after life test perform final electrical parameter tests, subgroups 1, 7,
and 9.
classes Q and V or MIL-PRF-38535, appendix A for device class M.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
system application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a
record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings
covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone [phone].
[phone].
MIL-PRF-38535, MIL-HDBK-1331, and as follows:
subscripts. The initial character is always "t" and is followed by four descriptors. These characters specify two signal points
arranged in a "from-to" sequence that define a timing interval. The two descriptors for each signal specify the signal name
and the signal transitions. Thus the format is:
4.5 Delta measurements for device class V. Delta measurements, as specified in table IIA, shall be made and recorded
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a
6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43216-5000, or telephone
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
C IN, C OUT ......................................... Input and bi-directional output, terminal-to-GND capacitance.
GND ................................................... Ground zero voltage potential.
I CC ..................................................... Supply current.
I IL ....................................................... Input current low.
I IH ....................................................... Input current high.
T C ....................................................... Case temperature.
T A ....................................................... Ambient temperature.
V CC .................................................... Positive supply voltage.
V IC ..................................................... Positive input clamp voltage.
O/V ..................................................... Latch-up over-voltage.
6.5.1 Timing parameter abbreviations. All timing abbreviations use lower case characters with upper case character
DEFENSE SUPPLY CENTER COLUMBUS
Signal name from which interval is derived
Transition direction for first signal
Signal name to which interval is defined
Transition direction for second signal
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
t
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SIZE
A
X
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REVISION LEVEL
X
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R
X
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SHEET
5962-89598
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